IEEE VLSI Test Symposium 2018

San Francisco 2.1-22.4.2018

Selected publications

2018SEKANINA Lukáš, VAŠÍČEK Zdeněk, BOSIO Alberto, TRAIOLA Marcello, RECH Paolo, OLIVEIRA Daniel, FERNANDES Fernando and DI Carlo Stefano. Special Session: How Approximate Computing impacts Verification, Test and Reliability. 2018 IEEE 36th VLSI Test Symposium. San Francisco: IEEE Computer Society, 2018. ISBN 978-1-5386-3774-6.

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