Events

IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2012

Tallinn 18.-20.4.2012

The IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of nanoelectronic circuits and systems. The symposium also offers an insight into relevant European R&D collaborative programs, projects, and technology platforms.

Programme Committee (members from FIT)

Kotásek Zdeněk, doc. Ing., CSc., UPSY FIT VUT
Sekanina Lukáš, prof. Ing., Ph.D., UPSY FIT VUT

Steering Committee (members from FIT)

Kotásek Zdeněk, doc. Ing., CSc., UPSY FIT VUT, chairman

Section moderators (members from FIT)

Kotásek Zdeněk, doc. Ing., CSc., UPSY FIT VUT, Session 6B: Test Generation and Fault Detection
Sekanina Lukáš, prof. Ing., Ph.D., UPSY FIT VUT, Session 9A: Design Verification

Selected publications

2012KORČEK Pavol and ŽÁDNÍK Martin. Lightweight benchmarking of platforms for network traffic processing. In: Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Tallin: IEEE Computer Society, 2012, pp. 278-283. ISBN 978-1-4673-1185-4.
 RŮŽIČKA Richard and ŠIMEK Václav. NAND/NOR Gate Polymorphism in Low Temperature Environment. In: Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Tallinn: Institute of Electrical and Electronics Engineers, 2012, pp. 34-37. ISBN 978-1-4673-1185-4.
 STRAKA Martin, MIČULKA Lukáš, KAŠTIL Jan and KOTÁSEK Zdeněk. Test Platform for Fault Tolerant Systems Design Qualities Verification. In: 15th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Tallin: IEEE Computer Society, 2012, pp. 336-341. ISBN 978-1-4673-1185-4.
 STRNADEL Josef. Monitoring-Driven HW/SW Interrupt Overload Prevention for Embedded Real-Time Systems. In: Proceedings of the 15th International IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Tallin: IEEE Computer Society, 2012, pp. 121-126. ISBN 978-1-4673-1188-5.

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