IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2012

 

Tallinn 18.-20.4.2012

The IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of nanoelectronic circuits and systems. The symposium also offers an insight into relevant European R&D collaborative programs, projects, and technology platforms.

Programme Committee (members from FIT)

Kotásek Zdeněk, doc. Ing., CSc.
Sekanina Lukáš, prof. Ing., Ph.D.

Steering Committee (members from FIT)

Kotásek Zdeněk, doc. Ing., CSc., chairman

Section moderators (members from FIT)

Kotásek Zdeněk, doc. Ing., CSc., Session 6B: Test Generation and Fault Detection
Sekanina Lukáš, prof. Ing., Ph.D., Session 9A: Design Verification

Selected publications

2012Korček Pavol, Žádník Martin: Lightweight benchmarking of platforms for network traffic processing, In: Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallin, EE, IEEE CS, 2012, p. 278-283, ISBN 978-1-4673-1185-4
 Růžička Richard, Šimek Václav: NAND/NOR Gate Polymorphism in Low Temperature Environment, In: Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, Tallinn, EE, IEEE, 2012, p. 34-37, ISBN 978-1-4673-1185-4
 Straka Martin, Mičulka Lukáš, Kaštil Jan, Kotásek Zdeněk: Test Platform for Fault Tolerant Systems Design Qualities Verification, In: 15th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Tallin, EE, IEEE CS, 2012, p. 336-341, ISBN 978-1-4673-1185-4
 Strnadel Josef: Monitoring-Driven HW/SW Interrupt Overload Prevention for Embedded Real-Time Systems, In: Proceedings of the 15th International IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallin, EE, IEEE CS, 2012, p. 121-126, ISBN 978-1-4673-1188-5

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