Diagnostics Research Group

• problems related to diagnosis of electronic systems and
• design of fault tolerant systems.

Research interests

• Design for testability (diagnosis of function blocks and memories, built-in diagnosis), testability analysis
• Fault tolerant systems (on-line testing techniques, checkers, dependability models, partial dynamic reconfiguration based on an FPGA, overload prevention solutions for embedded systems)
• Utilization of evolutionary approaches during a circuit design phase (benchmark generation methods, optimizations for testability, power and test time reduction)

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