Detail publikace

Formal and Analytical Approaches to the Testability Analysis - the Comparison

KOTÁSEK Zdeněk, RŮŽIČKA Richard a STRNADEL Josef. Formal and Analytical Approaches to the Testability Analysis - the Comparison. In: Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001. Gyor: SZIF-UNIVERSITAS spol. s r. o.., Hungary, 2001, s. 123-128. ISBN 963-7175-16-4.
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Kotásek Zdeněk, Doc. Ing., CSc. (UIVT-VVS FEI VUT)
Růžička Richard, Ing. (UIVT FEI VUT)
Strnadel Josef, Ing. (UIVT FEI VUT)
URL
Rok
2001
Strany
123-128
Sborník
Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001
Konference
IEEE Design and Diagnostics of Electronic Circuits and Systems 2001, Gyor, HU
ISBN
963-7175-16-4
Vydavatel
SZIF-UNIVERSITAS spol. s r. o.., Hungary
Místo
Gyor, HU
BibTeX 
@INPROCEEDINGS{FITPUB6692,
   author = "Zden\v{e}k Kot\'{a}sek and Richard R\r{u}\v{z}i\v{c}ka and Josef Strnadel",
   title = "Formal and Analytical Approaches to the Testability Analysis - the Comparison",
   pages = "123--128",
   booktitle = "Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001",
   year = 2001,
   location = "Gyor, HU",
   publisher = "SZIF-UNIVERSITAS Ltd., Hungary",
   ISBN = "963-7175-16-4",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/6692"
}
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