Detail publikace

Nested Loops Degree Impact on RTL Digital Circuit Testability

STRNADEL Josef. Nested Loops Degree Impact on RTL Digital Circuit Testability. In: Programmable Devices and Systems. Oxford: Elsevier Science, 2003, s. 202-207. ISBN 0-08-044130-0.
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Strnadel Josef, Ing., Ph.D. (UPSY FIT VUT)
Rok
2003
Strany
202-207
Sborník
Programmable Devices and Systems
Konference
IFAC Workshop on Programmable Devices and Systems, Ostrava, CZ
ISBN
0-08-044130-0
Vydavatel
Elsevier Science
Místo
Oxford, GB
BibTeX 
@INPROCEEDINGS{FITPUB7135,
   author = "Josef Strnadel",
   title = "Nested Loops Degree Impact on RTL Digital Circuit Testability",
   pages = "202--207",
   booktitle = "Programmable Devices and Systems",
   year = 2003,
   location = "Oxford, GB",
   publisher = "Elsevier Science",
   ISBN = "0-08-044130-0",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7135"
}
Soubory
Nahoru