Conference paperSTRNADEL Josef. Modeling and Analysis of FaultTolerant Systems by Means of UPPAAL SMC: Method and Benefits. In: Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Bratislava: Slovak University of Technology in Bratislava, 2016, pp. 3237. ISBN 9788080862565.  Publication language:  english 

Original title:  Modeling and Analysis of FaultTolerant Systems by Means of UPPAAL SMC: Method and Benefits 

Title (cs):  Modelování a analýza vůči poruchám odolných systémů prostředky UPPAAL SMC: Metoda a výhody 

Pages:  3237 

Proceedings:  Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) 

Conference:  19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2016 

Place:  Bratislava, SK 

Year:  2016 

ISBN:  9788080862565 

Publisher:  Slovak University of Technology in Bratislava 

Keywords 

modeling, analysis, fault tolerant, FT, statistical model checking, SMC, UPPAAL SMC, reliability analysis, probability distribution, bathtub, fault, transient, permanent, intermittent, behavior, type, description, signalization, scenario, tripple modular redundancy, TMR 
Annotation 

The paper presents a method of modeling and analysis of faulttolerant (FT) electronic systems by means of a novel statistical model checking (SMC) approach available in the UPPAAL SMC tool. The method can be seen as an alternative to classical analytic approaches based on instruments such as faulttree or Markov reliability models of the abovespecified systems. Main goal of the paper is to show that  taking the advantage of SMC  the reliability analysis of systems can be facilitated even for adverse conditions such as inconstant failure (hazard) rate of inner system components. In the paper, basic terms and principles related to modeling and analysis of FT systems are summarized, followed by a short introduction to the UPPAAL SMC tool, its practical applicability to analysis and modeling of basic FT systems and evaluation of the results achieved on basis of the tool. 
BibTeX: 

@INPROCEEDINGS{
author = {Josef Strnadel},
title = {Modeling and Analysis of FaultTolerant Systems by Means of
UPPAAL SMC: Method and Benefits},
pages = {3237},
booktitle = {Informal Proceedings of the 2016 IEEE 19th International
Symposium on Design and Diagnostics of Electronic Circuits
\& Systems (DDECS)},
year = {2016},
location = {Bratislava, SK},
publisher = {Slovak University of Technology in Bratislava},
ISBN = {9788080862565},
language = {english},
url = {http://www.fit.vutbr.cz/research/view_pub.php.en.iso88592?id=11073}
} 
