Conference paper

STRNADEL Josef. Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits. In: Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Bratislava: Slovak University of Technology in Bratislava, 2016, pp. 32-37. ISBN 978-80-8086-256-5.
Publication language:english
Original title:Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits
Title (cs):Modelování a analýza vůči poruchám odolných systémů prostředky UPPAAL SMC: Metoda a výhody
Pages:32-37
Proceedings:Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Conference:19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2016
Place:Bratislava, SK
Year:2016
ISBN:978-80-8086-256-5
Publisher:Slovak University of Technology in Bratislava
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Keywords
modeling, analysis, fault tolerant, FT, statistical model checking, SMC, UPPAAL SMC, reliability analysis, probability distribution, bathtub, fault, transient, permanent, intermittent, behavior, type, description, signalization, scenario, tripple modular redundancy, TMR
Annotation
The paper presents a method of modeling and analysis of fault-tolerant (FT) electronic systems by means of a novel statistical model checking (SMC) approach available in the UPPAAL SMC tool. The method can be seen as an alternative to classical analytic approaches based on instruments such as fault-tree or Markov reliability models of the above-specified systems. Main goal of the paper is to show that - taking the advantage of SMC - the reliability analysis of systems can be facilitated even for adverse conditions such as inconstant failure (hazard) rate of inner system components. In the paper, basic terms and principles related to modeling and analysis of FT systems are summarized, followed by a short introduction to the UPPAAL SMC tool, its practical applicability to analysis and modeling of basic FT systems and evaluation of the results achieved on basis of the tool.
BibTeX:
@INPROCEEDINGS{
   author = {Josef Strnadel},
   title = {Modeling and Analysis of Fault-Tolerant Systems by Means of
	UPPAAL SMC: Method and Benefits},
   pages = {32--37},
   booktitle = {Informal Proceedings of the 2016 IEEE 19th International
	Symposium on Design and Diagnostics of Electronic Circuits
	\& Systems (DDECS)},
   year = {2016},
   location = {Bratislava, SK},
   publisher = {Slovak University of Technology in Bratislava},
   ISBN = {978-80-8086-256-5},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php.en.iso-8859-2?id=11073}
}

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