Conference paper

STRNADEL Josef. Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis. In: Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference. Brno: Brno University of Technology, 2007, pp. 333-338. ISBN 978-80-214-3470-7.
Publication language:english
Original title:Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis
Title (cs):Sada nástrojů pro experimentování s optimalizacemi v oblasti kompromisu mezi cenou a kvalitou návrhu pro snadnou testovatelnost číslicových obvodů
Pages:333-338
Proceedings:Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference
Conference:14th Electronic Devices and Systems IMAPS CS International Conference
Place:Brno, CZ
Year:2007
ISBN:978-80-214-3470-7
Publisher:Brno University of Technology
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Keywords
scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain
Annotation
The paper presents a toolset utilizable for learning and training principles related to design-for-testability of digital systems by means of structural and ad-hoc techniques. Actually, the toolset consists of two tools named SET and CADeT. Using the tools, user is allowed to make experiments in the optimization area which goal is to achieve feasible cost/quality trade-off among design-constraints and diagnostic requirements posed on a digital system. In the paper, basic education-related characteristics of the tools are briefly presented.
BibTeX:
@INPROCEEDINGS{
   author = {Josef Strnadel},
   title = {Educational Toolset for Experimenting with Optimizations in
	the Area of Cost/Quality Trade-Offs Related to Digital
	Circuit Diagnosis},
   pages = {333--338},
   booktitle = {Proceedings of 14th Electronic Devices and Systems IMAPS CS
	International Conference},
   year = {2007},
   location = {Brno, CZ},
   publisher = {Brno University of Technology},
   ISBN = {978-80-214-3470-7},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php.en.iso-8859-2?id=8401}
}

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