Conference paper

RŮŽIČKA Richard, SEKANINA Lukáš and PROKOP Roman. Physical Demonstration of Polymorphic Self-checking Circuits. In: Proc. of the 14th IEEE Int. On-Line Testing Symposium. Los Alamitos: IEEE Computer Society, 2008, pp. 31-36. ISBN 978-0-7695-3264-6.
Publication language:english
Original title:Physical Demonstration of Polymorphic Self-checking Circuits
Title (cs):Physical Demonstration of Polymorphic Self-checking Circuits
Pages:31-36
Proceedings:Proc. of the 14th IEEE Int. On-Line Testing Symposium
Conference:14th IEEE International On-line Testing Symposium 2008
Place:Los Alamitos, US
Year:2008
ISBN:978-0-7695-3264-6
Publisher:IEEE Computer Society
URL: [PDF]
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Keywords
digital circuit, polymorphic gate, self-checking, adder
Annotation
Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized in a self-checking polymorphic adder. This paper presents an experimental evaluation of this novel implementation.
BibTeX:
@INPROCEEDINGS{
   author = {Richard R{\r{u}}{\v{z}}i{\v{c}}ka and Luk{\'{a}}{\v{s}}
	Sekanina and Roman Prokop},
   title = {Physical Demonstration of Polymorphic Self-checking Circuits},
   pages = {31--36},
   booktitle = {Proc. of the 14th IEEE Int. On-Line Testing Symposium},
   year = {2008},
   location = {Los Alamitos, US},
   publisher = {IEEE Computer Society},
   ISBN = {978-0-7695-3264-6},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php.en.iso-8859-2?id=8652}
}

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