Conference paper

ČEKAN Ondřej and KOTÁSEK Zdeněk. Random Test Generation Through a Probabilistic Constrained Grammar. In: INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Budapešť, 2018, pp. 5-8.
Publication language:english
Original title:Random Test Generation Through a Probabilistic Constrained Grammar
Pages:5-8
Proceedings:INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Conference:21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2018
Place:Budapešť, HU
Year:2018
Annotation
The paper introduces a probabilistic constrained grammar which is a newly formed grammar system for the use in the area of test stimuli generation. The grammar extends the existing probabilistic context-free grammar and establishes constraints for the grammar limitations. Stimuli obtained through the proposed principle are used in functional verification of a RISC processor and the coverage metric is evaluated. The paper also contains examples of how to define a problem of assembly code generation for processors.
BibTeX:
@INPROCEEDINGS{
   author = {Ond{\v{r}}ej {\v{C}}ekan and Zden{\v{e}}k
	Kot{\'{a}}sek},
   title = {Random Test Generation Through a Probabilistic
	Constrained Grammar},
   pages = {5--8},
   booktitle = {INFORMAL PROCEEDINGS 21st IEEE International Symposium on
	Design and Diagnostics of Electronic Circuits and Systems},
   year = {2018},
   location = {Budape{\v{s}}{\v{t}}, HU},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php.en?id=11605}
}

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