VAŠÍČEK Zdeněk. Relaxed equivalence checking: a new challenge in logic synthesis. In: *Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems*. Dresden: IEEE Computer Society, 2017, pp. 1-6. ISBN 978-1-5386-0472-4. |

Publication language: | english |
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Original title: | Relaxed equivalence checking: a new challenge in logic synthesis |
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Title (cs): | Přibližná ekvivalence: nový problém logické syntézy |
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Pages: | 1-6 |
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Proceedings: | Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems |
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Conference: | 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2017 |
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Place: | Dresden, DE |
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Year: | 2017 |
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ISBN: | 978-1-5386-0472-4 |
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Publisher: | IEEE Computer Society |
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Files: | |
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Soubor /pub/11410/07968435.pdf nemáte právo číst: you don't have right to read /pub/11410/07968435.pdf |

Keywords |
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equivalence checking, relaxed equivalence checking, logic circuits, formal techniques, sat solvers, binary decision diagrams |

Annotation |
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The functional equivalence has always been the integral part of virtually every logic synthesis tool. The formal equivalence checking represents a key process that helps logic synthesis tool guarantee that two representations of a circuit design exhibit exactly the same behavior. Among others,equivalence checking is routinely applied to prove that a synthesized digital circuit is logically equivalent to the RTL source code. Although formal equivalence checking has matured greatly during the last two decades and designs with millions of gates can be handled and verified in reasonable time, a new challenge has emerged with the recent advent of approaches addressing the problem of synthesis of approximate circuits. |

BibTeX: |
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@INPROCEEDINGS{
author = {Zden{\v{e}}k Va{\v{s}}{\'{i}}{\v{c}}ek},
title = {Relaxed equivalence checking: a new challenge in logic
synthesis},
pages = {1--6},
booktitle = {Proceedings 2017 IEEE 20th International Symposium on Design
and Diagnotics of Electronic Circuit \& Systems},
year = {2017},
location = {Dresden, DE},
publisher = {IEEE Computer Society},
ISBN = {978-1-5386-0472-4},
language = {english},
url = {http://www.fit.vutbr.cz/research/view_pub.php?id=11410}
} |