Conference paper

BARTOŠ Pavel and KOTÁSEK Zdeněk. Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires. In: Proceedings of CSE 2012 International Scientific Conference on Computer Science and Engineering. Košice: Faculty of Electrical Engineering and Informatics, University of Technology Košice, 2012, pp. 162-169. ISBN 978-80-8143-049-7.
Publication language:english
Original title:Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires
Title (cs):Redukce počtu testovacích vektorů založená na extrakci parazitních kapacit vodičů řetězce scan
Pages:162-169
Proceedings:Proceedings of CSE 2012 International Scientific Conference on Computer Science and Engineering
Conference:International Scientific Conference on Computer Science and Engineering, CSE 2012
Place:Košice, SK
Year:2012
ISBN:978-80-8143-049-7
Publisher:Faculty of Electrical Engineering and Informatics, University of Technology Košice
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Keywords
scan chain, reorganization, reordering, test, vector, bridge
Annotation
In this paper, method for scan chain optimisation performed after physical layout is presented. It is shown how the method can be used to decrease the number of test vectors. The principles of the method are based on parasitic capacity extraction, eliminating some bridging faults in the physical layout and subsequent reduction of the number of test vectors needed to test the circuit. The method was verified on circuits from benchmark set, experimental results are provided and discussed. It is expected that the method can be used in mass production of electronic components.
BibTeX:
@INPROCEEDINGS{
   author = {Pavel Barto{\v{s}} and Zden{\v{e}}k Kot{\'{a}}sek},
   title = {Reduction of Test Vectors Number based on Parasitic Capacity
	Extraction of Scan Chain Wires},
   pages = {162--169},
   booktitle = {Proceedings of CSE 2012 International Scientific Conference
	on Computer Science and Engineering},
   year = {2012},
   location = {Ko{\v{s}}ice, SK},
   publisher = {Faculty of Electrical Engineering and Informatics,
	University of Technology Ko{\v{s}}ice},
   ISBN = {978-80-8143-049-7},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=10033}
}

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