Conference paper

ZACHARIÁŠOVÁ Marcela, BOLCHINI Cristiana and KOTÁSEK Zdeněk. Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability. In: IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Karlovy Vary: IEEE Computer Society, 2013, pp. 275-278. ISBN 978-1-4673-6133-0.
Publication language:english
Original title:Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability
Title (cs):Analýza a porovnání funkční verifikace a ATPG pro testování spolehlivosti
Pages:275-278
Proceedings:IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Conference:IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2013
Place:Karlovy Vary, CZ
Year:2013
ISBN:978-1-4673-6133-0
Publisher:IEEE Computer Society
Keywords
ATPG, funkční verifikace.
Annotation
As the complexity of current hardware systems rises rapidly, it is a challenging task to harden these systems against faults and to complete their verification and manufacturing test. Not only that verification and testing take a considerable amount of time but the number of design errors, faults, manufacturing defects and crosstalks increases with the rising complexity as well. Furthermore, when a system is designed to be reliable new issues come into play making the picture even more complex. In this paper we performed a detailed analysis of two approaches
devoted to verification of hardened systems, with respect to the
test set generation: the first one is based on classical Automatic
Test Pattern Generation, the second one on Constrained-random
Stimulus Generation. We evaluated their qualities as well as their
drawbacks and introduced few ideas about their combination
in order to create a new promising approach for verification of
reliable systems.
BibTeX:
@INPROCEEDINGS{
   author = {Marcela Zachari{\'{a}}{\v{s}}ov{\'{a}} and Cristiana
	Bolchini and Zden{\v{e}}k Kot{\'{a}}sek},
   title = {Analysis and Comparison of Functional Verification and ATPG
	for Testing Design Reliability},
   pages = {275--278},
   booktitle = {IEEE 16th International Symposium on Design and Diagnostics
	of Electronic Circuits and Systems},
   year = {2013},
   location = {Karlovy Vary, CZ},
   publisher = {IEEE Computer Society},
   ISBN = {978-1-4673-6133-0},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=10274}
}

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