Conference paper

STRNADEL Josef and KOTÁSEK Zdeněk. Normalized Testability Measures at RT Level: Utilization and Reasons for Creation. In: Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems. Ostrava, 2002, pp. 297-304. ISBN 80-85988-71-2.
Publication language:english
Original title:Normalized Testability Measures at RT Level: Utilization and Reasons for Creation
Title (cs):Normalizované Míry Testovatelnosti na RT úrovni popisu: Použití a důvody k vytvoření
Pages:297-304
Proceedings:Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems
Conference:36th Spring International Conference MOSIS 2002 Modelling and Simulation of Systems
Series:Vol. I.
Place:Ostrava, CZ
Year:2002
ISBN:80-85988-71-2
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Keywords
Register-transfer level, controllability, observability, testability, testability analysis
Annotation
The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.
BibTeX:
@INPROCEEDINGS{
   author = {Josef Strnadel and Zden{\v{e}}k Kot{\'{a}}sek},
   title = {Normalized Testability Measures at RT Level: Utilization and
	Reasons for Creation},
   pages = {297--304},
   booktitle = {Proceedings of 36th International Conference MOSIS`02
	Modeling and Simulation of Systems},
   series = {Vol. I.},
   year = {2002},
   location = {Ostrava, CZ},
   ISBN = {80-85988-71-2},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=6917}
}

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