Conference paper

RŮŽIČKA Richard. The Formal Approach to the RTL Test Application Problem Using Petri Nets. In: Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002. Brno: Faculty of Information Technology BUT, 2002, pp. 78-86. ISBN 80-214-2094-4.
Publication language:english
Original title:The Formal Approach to the RTL Test Application Problem Using Petri Nets
Title (cs):Formální přístup k problému aplikace testu na obvod na úrovni RT s využitím Petriho sítí
Pages:78-86
Proceedings:Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002
Conference:IEEE Design and Diagnostics of Electronic Circuits and Systems 2002
Place:Brno, CZ
Year:2002
ISBN:80-214-2094-4
Publisher:Faculty of Information Technology BUT
Keywords
Design for Testability, Testability Analysis, Test Application Problem, Petri Nets
Annotation
An approach to solve the test application problem is presented. On the basis of RT-level digital circuit formal model, properties of circuit elements, which are important for test controller synthesis, are discussed. Algorithm to extract such information from the model of the circuit and algorithm to create a model of test application to the selected circuit element are presented. To evaluate the relevance of given path for diagnostic data and possibility of parallelism, Petri Nets concept is used.
BibTeX:
@INPROCEEDINGS{
   author = {Richard R{\r{u}}{\v{z}}i{\v{c}}ka},
   title = {The Formal Approach to the RTL Test Application Problem
	Using Petri Nets},
   pages = {78--86},
   booktitle = {Proceedings of IEEE Design and Diagnostics of Electronic
	Circuits and Systems 2002},
   year = {2002},
   location = {Brno, CZ},
   publisher = {Faculty of Information Technology BUT},
   ISBN = {80-214-2094-4},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=6930}
}

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