Conference paper

STRNADEL Josef and KOTÁSEK Zdeněk. Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level. In: Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002. Los Alamitos: IEEE Computer Society Press, 2002, pp. 166-173. ISBN 0-7695-1790-0.
Publication language:english
Original title:Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level
Title (cs):Zlepšení testovatelnosti založené na kombinaci analytických a evolučních přístupů na RT úrovni popisu
Pages:166-173
Proceedings:Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002
Conference:EUROMICRO Symposium on Digital System Design: Architecture, Methods and Tools
Place:Los Alamitos, US
Year:2002
ISBN:0-7695-1790-0
Publisher:IEEE Computer Society Press
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Keywords
design for testability, scan technique, scan register, scan chain, state-space analysis, evolutionary approach, genetic algorithm
Annotation
In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area overhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level.
BibTeX:
@INPROCEEDINGS{
   author = {Josef Strnadel and Zden{\v{e}}k Kot{\'{a}}sek},
   title = {Testability Improvements Based on the Combination of
	Analytical and Evolutionary Approaches at RT Level},
   pages = {166--173},
   booktitle = {Proceedings of Euromicro Symposium on Digital System Design
	Architectures, Methods and Tools DSD'2002},
   year = {2002},
   location = {Los Alamitos, US},
   publisher = {IEEE Computer Society Press},
   ISBN = {0-7695-1790-0},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=6980}
}

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