Conference paper

STRNADEL Josef. Nested Loops Degree Impact on RTL Digital Circuit Testability. In: Programmable Devices and Systems. Oxford: Elsevier Science, 2003, pp. 202-207. ISBN 0-08-044130-0.
Publication language:english
Original title:Nested Loops Degree Impact on RTL Digital Circuit Testability
Pages:202-207
Proceedings:Programmable Devices and Systems
Conference:IFAC Workshop on Programmable Devices and Systems
Place:Oxford, GB
Year:2003
ISBN:0-08-044130-0
Publisher:Elsevier Science
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Keywords
Testability, feedback loop, directed graph, ordered set, graph algorithm
Annotation
The existence of loops in a circuit structure causes problems in both test generation and application. Thus, the problem of identifying loops becomes an important task during testability analysis or, later, e.g., during allocation-for testability process. When nested loops occur in the circuit, it is necessary to accurately determine the most nested one to improve circuit testability significantly, with minimal design cost. This paper deals with the problem of identifying nested loops including their nesting degree in the register-transfer level (RTL) digital circuit structure as well as with the impact of such loops on the circuit testability.
BibTeX:
@INPROCEEDINGS{
   author = {Josef Strnadel},
   title = {Nested Loops Degree Impact on RTL Digital Circuit
	Testability},
   pages = {202--207},
   booktitle = {Programmable Devices and Systems},
   year = {2003},
   location = {Oxford, GB},
   publisher = {Elsevier Science},
   ISBN = {0-08-044130-0},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7135}
}

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