Conference paper

KOTÁSEK Zdeněk, MIKA Daniel and STRNADEL Josef. Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. In: Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. Poznaň: Publishing House of Poznan University of Technology, 2003, pp. 233-238. ISBN 83-7143-557-6.
Publication language:english
Original title:Methodologies of RTL Partial Scan Analysis and Their Comparison
Title (cs):Sbroník IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems
Pages:233-238
Proceedings:Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems
Conference:6th IEEE International Workshop On DDECS
Place:Poznaň, PL
Year:2003
ISBN:83-7143-557-6
Publisher:Publishing House of Poznan University of Technology
Keywords
Register Transfer Level, Feedback Loop, Genetic Algorithm
Annotation
In the paper, two different methodologies for the identification of registers to be included into the partial scan chain and principles of their implementation are described briefly. One of them is based on the utilisation of genetic algorithms, the other one on the identification of feedback loops. An attention is paid to the computation of time and space complexities of the developed algorithms. The possibility of the complete state-space exploration (all possible scan chain configurations) is also discussed. It is derived that algorithms based on genetic algorithms allow to gain sub-optimal solutions while fulfilling user requirements. The combination of both methodologies is investigated and the complexities analysed. Experimental results are described.
BibTeX:
@INPROCEEDINGS{
   author = {Zden{\v{e}}k Kot{\'{a}}sek and Daniel Mika and Josef
	Strnadel},
   title = {Methodologies of RTL Partial Scan Analysis and Their
	Comparison},
   pages = {233--238},
   booktitle = {Proceeding of IEEE Workshop on Design and Diagnostic of
	Electronic Circuits and Systems},
   year = {2003},
   location = {Pozna{\v{n}}, PL},
   publisher = {Publishing House of Poznan University of Technology},
   ISBN = {83-7143-557-6},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7159}
}

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