Conference paper

STRNADEL Josef. Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability. In: Proceedings of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. Poznan: Publishing House of Poznan University of Technology, 2003, pp. 303-304. ISBN 83-7143-557-6.
Publication language:english
Original title:Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability
Title (cs):Algebraická analýza závislostí zpětnovazebních smyček vedoucí ke zlepšení testovatelnosti RTL číslicových obvodů
Pages:303-304
Proceedings:Proceedings of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems
Conference:6th IEEE International Workshop On DDECS
Place:Poznan, PL
Year:2003
ISBN:83-7143-557-6
Publisher:Publishing House of Poznan University of Technology
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Keywords
Feedback vertex set problem, feedback arc set problem, loop coverage, loop dependencies, algebraic analysis, linear algebra, matrix operations
Annotation
The existence of loops in a circuit structure causes problems in both test generation and application. When nested loops occur in the circuit, it is necessary to break the most nested one(s) to improve circuit testability significantly, with minimal design cost. The paper deals with a new method of detecting and breaking loops in the register-transfer level (RTL) digital circuit structure.
BibTeX:
@INPROCEEDINGS{
   author = {Josef Strnadel},
   title = {Algebraic Analysis of Feedback Loop Dependencies in Order of
	Improving RTL Digital Circuit Testability},
   pages = {303--304},
   booktitle = {Proceedings of IEEE Workshop on Design and Diagnostic of
	Electronic Circuits and Systems},
   year = {2003},
   location = {Poznan, PL},
   publisher = {Publishing House of Poznan University of Technology},
   ISBN = {83-7143-557-6},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7160}
}

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