Conference paper

SEKANINA Lukáš and RŮŽIČKA Richard. On the Automatic Design of Testable Circuits. In: Proceedings of IEEE Workshop on Design nad Diagnostics of Electronic Circuits and Systems. Poznań: Publishing House of Poznan University of Technology, 2003, pp. 299-300. ISBN 83-7143-557-6.
Publication language:english
Original title:On the Automatic Design of Testable Circuits
Title (cs):Příspěvek k automatizovanému návrhu testovatelných obvodů
Pages:299-300
Proceedings:Proceedings of IEEE Workshop on Design nad Diagnostics of Electronic Circuits and Systems
Conference:6th IEEE International Workshop On DDECS
Place:Poznań, PL
Year:2003
ISBN:83-7143-557-6
Publisher:Publishing House of Poznan University of Technology
Keywords
Evolutionary design, testability, digital circuits
Annotation
An approach to the design of non-trivial circuits that are competitive with conventional designs in terms of quality as well as implementation cost, and furthermore, which are easily testable, is introduced in this paper.
Abstract
An approach to the design of non-trivial circuits that are competitive with conventional designs in terms of quality as well as implementation cost, and furthermore, which are easily testable, is introduced in this paper.
BibTeX:
@INPROCEEDINGS{
   author = {Luk{\'{a}}{\v{s}} Sekanina and Richard
	R{\r{u}}{\v{z}}i{\v{c}}ka},
   title = {On the Automatic Design of Testable Circuits},
   pages = {299--300},
   booktitle = {Proceedings of IEEE Workshop on Design nad Diagnostics of
	Electronic Circuits and Systems},
   year = {2003},
   location = {Pozna{\'{n}}, PL},
   publisher = {Publishing House of Poznan University of Technology},
   ISBN = {83-7143-557-6},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7162}
}

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