Conference paper

MIKA Daniel. The Test Controller Design Based on I-Path Concept. In: Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3. Brno: Faculty of Electrical Engineering and Communication BUT, 2003, pp. 624-628. ISBN 80-214-2379-X.
Publication language:english
Original title:The Test Controller Design Based on I-Path Concept
Title (cs):Návrh řadiče testu na bázi i-cest
Pages:624-628
Proceedings:Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3
Conference:ELECTRICAL ENGINEERING, INFORMATION AND COMMUNICATION TECHNOLOGIES 2003
Place:Brno, CZ
Year:2003
ISBN:80-214-2379-X
Publisher:Faculty of Electrical Engineering and Communication BUT
Keywords
Register Transfer Level, I-path, I-mode, Circuit Under Test
Annotation
In the paper the process of the test controller design and synthesis on register transfer level is described. The principle of circuit element access is discussed during the test plan scheduling. The formal tool - a mathematical logic and a set theory - is used as suitable tool for test controller design process. The problem of I-path is explained and a simple example of I-path is also demonstrated.
BibTeX:
@INPROCEEDINGS{
   author = {Daniel Mika},
   title = {The Test Controller Design Based on I-Path Concept},
   pages = {624--628},
   booktitle = {Proceedings of 9th Conference and Competition STUDENT EEICT
	2003 Volume 3},
   year = {2003},
   location = {Brno, CZ},
   publisher = {Faculty of Electrical Engineering and Communication BUT},
   ISBN = {80-214-2379-X},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7168}
}

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