Conference paper

MIKA Daniel and KOTÁSEK Zdeněk. The Test Controller Model Based on The Timed Automaton. In: Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems. Ostrava, 2003, pp. 107-114. ISBN 80-85988-86-0.
Publication language:english
Original title:The Test Controller Model Based on The Timed Automaton
Title (cs):Model řadiče testu založený na časovaném automatu
Pages:107-114
Proceedings:Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems
Conference:MOSIS 2003 - Modelling and Simulation of Systems
Place:Ostrava, CZ
Year:2003
ISBN:80-85988-86-0
Keywords
Register Transfer Level (RTL), Circuit Under Test (CUT), Test Controller Model
Annotation
In the paper the process of the test controller model design and synthesis on Register Transfer Level (RTL) is described. The principles of test application to circuit element by the test controller model is discussed. The problem of I-path is explained. The formal tool - the timed automaton - is used as a suitable tool for test controller model. In the end of paper there is a simple example of timed automaton, which represents a model of particular behavior of the test controller.
BibTeX:
@INPROCEEDINGS{
   author = {Daniel Mika and Zden{\v{e}}k Kot{\'{a}}sek},
   title = {The Test Controller Model Based on The Timed Automaton},
   pages = {107--114},
   booktitle = {Proceedings of 37th International Conference MOSIS03
	Modelling and Simulation of Systems},
   year = {2003},
   location = {Ostrava, CZ},
   ISBN = {80-85988-86-0},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7172}
}

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