Conference paper

SEKANINA Lukáš and RŮŽIČKA Richard. Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers. In: The 2003 NASA/DoD Conference on Evolvable Hardware. Los Alamitos: IEEE Computer Society Press, 2003, pp. 135-144. ISBN 0-7695-1977-6.
Publication language:english
Original title:Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers
Title (cs):Snadno testovatelné obrazové operátory: Třída obvodů, kde evoluční návrh poráží inženýry
Pages:135-144
Proceedings:The 2003 NASA/DoD Conference on Evolvable Hardware
Conference:The 2003 NASA/DoD Conference on Evolvable Hardware
Place:Los Alamitos, US
Year:2003
ISBN:0-7695-1977-6
Publisher:IEEE Computer Society Press
URL:http://www.fit.vutbr.cz/~sekanina/publ/eh03/eh03a.pdf [PDF]
URL:http://www.fit.vutbr.cz/~sekanina/publ/eh03/eh03etf.zip [ZIP]
Keywords
digital circuit, evolvable hardware, testability, image operator
Annotation
The paper deals with a class of image filters in which the evolutionary approach consistently produces excellent and innovative results. Furthermore, a method is proposed that leads to the automatic design of easily testable circuits. In particular we evolved salt and pepper noise filters, random shot noise filters, Gaussian noise filters, uniform random noise filters, and edge detectors.
BibTeX:
@INPROCEEDINGS{
   author = {Luk{\'{a}}{\v{s}} Sekanina and Richard
	R{\r{u}}{\v{z}}i{\v{c}}ka},
   title = {Easily Testable Image Operators: The Class of Circuits Where
	Evolution Beats Engineers},
   pages = {135--144},
   booktitle = {The 2003 NASA/DoD Conference on Evolvable Hardware},
   year = {2003},
   location = {Los Alamitos, US},
   publisher = {IEEE Computer Society Press},
   ISBN = {0-7695-1977-6},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7186}
}

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