Conference paper

KOTÁSEK Zdeněk. Survey of Partial Scan Methodologies. In: Research and Training Action for System on Chip Design, 5th FP Project. Bratislava: Slovak Academy of Science, 2004, p. 77.
Publication language:english
Original title:Partial Scan Methodologoies
Title (cs):Přehled metodik typu Partial Scan
Pages:77
Proceedings:Research and Training Action for System on Chip Design, 5th FP Project
Conference:Additional Hardware for IC Testability Improvement
Place:Bratislava, SK
Year:2004
Publisher:Slovak Academy of Science
Keywords
digital circuit testability, test application
Annotation
Partial scan methodologies are seen as an alternative to applying a test to a digital circuit. In the presentation a survey of the methodologies is given.
BibTeX:
@INPROCEEDINGS{
   author = {Zden{\v{e}}k Kot{\'{a}}sek},
   title = {Partial Scan Methodologoies},
   pages = {77},
   booktitle = {Research and Training Action for System on Chip Design, 5th
	FP Project},
   year = {2004},
   location = {Bratislava, SK},
   publisher = {Slovak Academy of Science},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7623}
}

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