Conference paperKOTÁSEK Zdeněk. Survey of Partial Scan Methodologies. In: Research and Training Action for System on Chip Design, 5th FP Project. Bratislava: Slovak Academy of Science, 2004, p. 77. | Publication language: | english |
---|
Original title: | Partial Scan Methodologoies |
---|
Title (cs): | Přehled metodik typu Partial Scan |
---|
Pages: | 77 |
---|
Proceedings: | Research and Training Action for System on Chip Design, 5th FP Project |
---|
Conference: | Additional Hardware for IC Testability Improvement |
---|
Place: | Bratislava, SK |
---|
Year: | 2004 |
---|
Publisher: | Slovak Academy of Science |
---|
Keywords |
---|
digital circuit testability, test application |
Annotation |
---|
Partial scan methodologies are seen as an alternative to applying a
test to a digital circuit. In the presentation a survey of the
methodologies is given. |
BibTeX: |
---|
@INPROCEEDINGS{
author = {Zden{\v{e}}k Kot{\'{a}}sek},
title = {Partial Scan Methodologoies},
pages = {77},
booktitle = {Research and Training Action for System on Chip Design, 5th
FP Project},
year = {2004},
location = {Bratislava, SK},
publisher = {Slovak Academy of Science},
language = {english},
url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7623}
} |
|