Conference paper

RŮŽIČKA Richard. A Complex Approach to Digital RTL Circuit Testability - iFCoRT System. In: Informal Digest of Papers of the IEEE European Test Symposium 2005. Tallinn: Tallinn University of Technology, 2005, pp. 156-157.
Publication language:english
Original title:A Complex Approach to Digital RTL Circuit Testability - iFCoRT System
Title (cs):Komplexní přístup k testovatelnosti číslicového obvodu na úrovni RT - Systém iFCoRT
Pages:156-157
Proceedings:Informal Digest of Papers of the IEEE European Test Symposium 2005
Conference:10th IEEE European Test Symposium 2005
Place:Tallinn, EE
Year:2005
Publisher:Tallinn University of Technology
Keywords
RT level diagnostics, i paths, design-for-testability
Annotation
In the paper, a complex approach to the RT level digital circuit diagnostics is presented. This system we call iFCoRT - I path Based, Formally Described and Proved Concept of RTL Digital Circuits Testability. The approach is based on the I path concept and employs Design-for-Testability principles such as Partial Scan etc. Presented approach includes the model of the circuit, testability analysis, testability verification, test scheduling and test controller synthesis. All modules of the system are formally specified and then are, step-by-step, formally proved their correctness.
BibTeX:
@INPROCEEDINGS{
   author = {Richard R{\r{u}}{\v{z}}i{\v{c}}ka},
   title = {A Complex Approach to Digital RTL Circuit Testability -
	iFCoRT System},
   pages = {156--157},
   booktitle = {Informal Digest of Papers of the IEEE European Test
	Symposium 2005},
   year = {2005},
   location = {Tallinn, EE},
   publisher = {Tallinn University of Technology},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=7804}
}

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