Conference paper

STRNADEL Josef. Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space. In: Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems. Prague: Czech Technical University Publishing House, 2006, pp. 161-162. ISBN 1-4244-0184-4.
Publication language:english
Original title:Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space
Title (cs):Plánování testu založené na prohledávání stavového prostoru I-schedule pro systémy na čipu vyžadující nízký příkon
Pages:161-162
Proceedings:Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
Conference:IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop
Place:Prague, CZ
Year:2006
ISBN:1-4244-0184-4
Publisher:Czech Technical University Publishing House
Keywords
test scheduling, power constraint, test access mechanism, sessionless, test application graph
Annotation
In the paper, novel sessionless approach to test-schedulling is presented. It utilizes so-called STEPs during special random-search based scheduling algorithm. The algorithm explores the state-space of so-called i-schedules whereas an i-schedule is an integer-vector encoded test-schedule represented by n-touple of STEPs. Proposed algorithm tries to link tests to STEPs in such a way there are no resource sharing conflicts in the best-found test schedule and hopefully, test schedule constraints are met maximally at minimal time and TAM values.
BibTeX:
@INPROCEEDINGS{
   author = {Josef Strnadel},
   title = {Power-Constrained, Sessionless SOC Test Scheduling Based on
	Exploration of I-Schedule State-Space},
   pages = {161--162},
   booktitle = {Proceedings of the 2006 IEEE Workshop on Design and
	Diagnostics of Electronic Circuits and Systems},
   year = {2006},
   location = {Prague, CZ},
   publisher = {Czech Technical University Publishing House},
   ISBN = {1-4244-0184-4},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=8029}
}

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