Conference paper

STRNADEL Josef. Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method. In: Proceedings of Electronic Devices and Systems IMAPS CS International Conference. Brno: Brno University of Technology, 2008, pp. 367-372. ISBN 978-80-214-3717-3.
Publication language:english
Original title:Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method
Title (cs):Zlepšení testovatelnosti víceúrovňových návrhů řízené analýzou testovatelnosti
Pages:367-372
Proceedings:Proceedings of Electronic Devices and Systems IMAPS CS International Conference
Conference:15th Electronic Devices and Systems IMAPS CS International Conference
Place:Brno, CZ
Year:2008
ISBN:978-80-214-3717-3
Publisher:Brno University of Technology
URL:http://www.fit.vutbr.cz/~strnadel/diag/taste [HTML]
URL:http://www.fit.vutbr.cz/~strnadel/publ/strnadel-eds08-www.pdf [PDF]
Keywords
digital, circuit, design, testability, multilevel, enhancement, guidance
Annotation
In the paper, multilevel extension of previously published register-transfer level testability analysis method is presented. It is illustrated how libraries and net-lists of multilevel designs can be described in special language developed for the purpose, how the method can be linked up to commercial electronic design automation tools and how information offered by the method can be utilized for guidance during testability enhancement of digital designs.
BibTeX:
@INPROCEEDINGS{
   author = {Josef Strnadel},
   title = {Testability Enhancement of Multilevel Designs Guided by
	Testability Analysis Method},
   pages = {367--372},
   booktitle = {Proceedings of Electronic Devices and Systems IMAPS CS
	International Conference},
   year = {2008},
   location = {Brno, CZ},
   publisher = {Brno University of Technology},
   ISBN = {978-80-214-3717-3},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=8631}
}

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