Conference paper

STRNADEL Josef. TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path. In: Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools. Los Alamitos: IEEE Computer Society, 2008, pp. 865-872. ISBN 978-0-7695-3277-6.
Publication language:english
Original title:TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path
Title (cs):TASTE: Soubor prostředků a otevřených knihoven pro analýzu testovatelnosti číslicových obvodů
Pages:865-872
Proceedings:Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools
Conference:11th EUROMICRO Conference on Digital Systems Design 2008
Place:Los Alamitos, US
Year:2008
ISBN:978-0-7695-3277-6
Publisher:IEEE Computer Society
URL:http://www.fit.vutbr.cz/~strnadel/diag/taste [HTML]
URL:http://www.fit.vutbr.cz/~strnadel/publ/strnadel-dsd08-www.pdf [PDF]
URL:http://www.fit.vutbr.cz/~strnadel/publ/strnadel_dsd08_pres.pdf [PDF]
URL:http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4669327&tag=1 [PDF]
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Keywords
digital, circuit, testability, analysis, scan, transparency, netlist, graph, model, searching, marking, reachability, library, component, template
Annotation
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a customer. Estimation of testability parameter strongly depends on how accurate information utilized for the estimation by a testability analysis method is. In the paper, two results of our previous, long-term research in the area of digital circuit testability analysis are summarized: principle of our testability analysis engine and libraries used to store the information outgoing from transparency models. The engine is general and the run-time and accuracy of its results strongly depends on the information stored in the libraries. If simple transparency model is utilized, information about circuit testability could be far away from real state of the circuit. Otherwise, testability information can approximate so serious parameter such as fault-coverage factor.
BibTeX:
@INPROCEEDINGS{
   author = {Josef Strnadel},
   title = {TASTE: Testability Analysis Engine and Opened Libraries for
	Digital Data Path},
   pages = {865--872},
   booktitle = {Proceedings of 11th Euromicro Conference on Digital Systems
	Design Architectures, Methods and Tools},
   year = {2008},
   location = {Los Alamitos, US},
   publisher = {IEEE Computer Society},
   ISBN = {978-0-7695-3277-6},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=8632}
}

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