| Strnadel, J., Kotásek, Z.: Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level, In: Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002, Los Alamitos, US, ICSP, 2002, p. 166-173, ISBN 0-7695-1790-0 | | Publication language: | english |
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| Original title: | Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level |
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| Title (cs): | Zlepšení testovatelnosti založené na kombinaci analytických a evolučních přístupů na RT úrovni popisu |
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| Pages: | 166-173 |
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| Proceedings: | Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002 |
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| Conference: | EUROMICRO Symposium on Digital System Design: Architecture, Methods and Tools |
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| Place: | Los Alamitos, US |
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| Year: | 2002 |
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| ISBN: | 0-7695-1790-0 |
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| Publisher: | IEEE Computer Society Press |
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| Files: | |
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| | Keywords |
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| design for testability, scan technique, scan register, scan chain, state-space analysis, evolutionary approach, genetic algorithm |
| Annotation |
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| In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area overhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level. |
| BibTeX: |
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@INPROCEEDINGS{
author = {Josef Strnadel and Zdeněk Kotásek},
title = {Testability Improvements Based on the Combination of
Analytical and Evolutionary Approaches at RT Level},
pages = {166--173},
booktitle = {Proceedings of Euromicro Symposium on Digital System Design
Architectures, Methods and Tools DSD'2002},
year = {2002},
location = {Los Alamitos, US},
publisher = {IEEE Computer Society Press},
ISBN = {0-7695-1790-0},
language = {english},
url = {http://www.fit.vutbr.cz/research/view_pub.php?id=6980}
} |
|