Conference paper| STAREČEK Lukáš, SEKANINA Lukáš and KOTÁSEK Zdeněk. Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration. In: Proc. of 2008 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop. Bratislava: IEEE Computer Society, 2008, pp. 255-258. ISBN 978-1-4244-2276-0. | | Publication language: | english |
|---|
| Original title: | Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration |
|---|
| Title (cs): | Redukce počtu testovacích vektorů pomocí rekonfigurace na úrovni hradel |
|---|
| Pages: | 255-258 |
|---|
| Proceedings: | Proc. of 2008 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop |
|---|
| Conference: | IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop |
|---|
| Place: | Bratislava, SK |
|---|
| Year: | 2008 |
|---|
| ISBN: | 978-1-4244-2276-0 |
|---|
| Publisher: | IEEE Computer Society |
|---|
| Files: | |
|---|
|
| | Keywords |
|---|
| digital circuit, test vector, reconfiguration |
| Annotation |
|---|
| In this paper, a new concept which allows the reduction of test vectors volume is presented. The concept is based on reconfiguration of some gates of circuit under test. Instead of testing the original circuit, a circuit which has the same topology (but some of its gate functions are reconfigured) is actually tested. Two possible implementations of the reconfiguration are investigated. Preliminary experiments indicate that test length can be reduced to approx. 70% of its initial value while the increase in transistors is moderate. |
| BibTeX: |
|---|
@INPROCEEDINGS{
author = {Luk{\'{a}}{\v{s}} Stare{\v{c}}ek and
Luk{\'{a}}{\v{s}} Sekanina and Zden{\v{e}}k
Kot{\'{a}}sek},
title = {Reduction of Test Vectors Volume by Means of
Gate-Level Reconfiguration},
pages = {255--258},
booktitle = {Proc. of 2008 IEEE Design and Diagnostics of Electronic
Circuits and Systems Workshop},
year = 2008,
location = {Bratislava, SK},
publisher = {IEEE Computer Society},
ISBN = {978-1-4244-2276-0},
language = {english},
url = {http://www.fit.vutbr.cz/research/view_pub.php.en?id=8603}
} |
|
Faculty of Information Technology