Conference paper

 
Křoustek, J., Židek, S., Kolář, D., Meduna, A.: Exploitation of Scattered Context Grammars to Model VLIW Instruction Constraints, In: Proceedings of the 12th Biennial Baltic Electronics Conference, Tallinn, EE, IEEE, 2010, p. 165-168, ISBN 978-1-4244-7357-1
Publication language:english
Original title:Exploitation of Scattered Context Grammars to Model VLIW Instruction Constraints
Title (cs):Využití gramatik s rozptýleným kontextem k modelování omezení instrukcí VLIW procesoru
Pages:165-168
Proceedings:Proceedings of the 12th Biennial Baltic Electronics Conference
Conference:12th Biennial Baltic Electronics Conference
Place:Tallinn, EE
Year:2010
URL:https://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5630284
ISBN:978-1-4244-7357-1
Publisher:Institute of Electrical and Electronics Engineers
Keywords
scattered context grammar, SCG, VLIW, assembler, conflicts, latency
Annotation
More and more nowadays data processing System-on-Chip (SoC) devices exploit the very long instruction word (VLIW) technology. The high performance of VLIW processors is achieved by a high instruction level parallelism. Program execution is scheduled statically at compilation time. Therefore, there is no need for run-time control mechanisms and hardware can be relatively simple. On the other hand, all constraints checks must be done by the compiler.

This paper describes formal method for modeling instruction level limitations of these processors. This method is based on scattered context grammars that generate proper assembler code. This concept has two advantages - formal description of the dependency checking process and high reduction of description complexity over other methods.
BibTeX:
@INPROCEEDINGS{
   author = {Jakub Křoustek and Stanislav Židek and Dušan Kolář and
	Alexander Meduna},
   title = {Exploitation of Scattered Context Grammars to Model VLIW
	Instruction Constraints},
   pages = {165--168},
   booktitle = {Proceedings of the 12th Biennial Baltic Electronics
	Conference},
   year = {2010},
   location = {Tallinn, EE},
   publisher = {Institute of Electrical and Electronics Engineers},
   ISBN = {978-1-4244-7357-1},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=9233}
}