Conference paper

 
Kaštil, J., Straka, M., Kotásek, Z.: Methodology for Increasing Reliability of FPGA Design via Partial Reconfiguration, In: The First Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN'12), Annecy, FR, Polimi, 2012, p. 1-4
Publication language:english
Original title:Methodology for Increasing Reliability of FPGA Design via Partial Reconfiguration
Title (cs):Metodologie pro návrh systémů s vysokou spolehlivostí do FPGA
Pages:1-4
Proceedings:The First Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN'12)
Conference:MEDIAN
Place:Annecy, FR
Year:2012
Publisher:Politecnico di Milano
Keywords
FPGA, partial dynamic reconfiguration, reliability, redundancy, checker, SEU, controller
Annotation
In the paper, the activities which aim at developing a methodology of fault tolerant systems design into FPGA platforms are presented. The methodology supports the detection a localization of all soft errors in the design and recovery mechanism which is based on the principles of partial dynamic reconfiguration of the chip. The main features of methodology are presented in the paper.
Abstract
In the paper, the activities which aim at developing a methodology of fault tolerant systems design into FPGA platforms are presented. The methodology supports the detection a localization of all soft errors in the design and recovery mechanism which is based on the principles of partial dynamic reconfiguration of the chip. The main features of methodology are presented in the paper.
BibTeX:
@INPROCEEDINGS{
   author = {Jan Kaštil and Martin Straka and Zdeněk Kotásek},
   title = {Methodology for Increasing Reliability of FPGA Design via
	Partial Reconfiguration},
   pages = {1--4},
   booktitle = {The First Workshop on Manufacturable and Dependable
	Multicore Architectures at Nanoscale (MEDIAN'12)},
   year = {2012},
   location = {Annecy, FR},
   publisher = {Politecnico di Milano},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=9904}
}