Conference paper

PŘIKRYL Zdeněk, MASAŘÍK Karel, HRUŠKA Tomáš and HUSÁR Adam. Fast Cycle-Accurate Interpreted Simulation. In: Tenth International Workshop on Microprocessor Test and Verification: Common Challenges and Solutions. Austin: IEEE Computer Society Press, 2009, pp. 9-14. ISBN 978-0-7695-4000-9.
Publication language:english
Original title:Fast Cycle-Accurate Interpreted Simulation
Title (cs):Rychlá interpretovaná simulace na úrovni cyklů
Pages:9-14
Proceedings:Tenth International Workshop on Microprocessor Test and Verification: Common Challenges and Solutions
Conference:Microprocessor Test and Verification
Place:Austin, US
Year:2009
ISBN:978-0-7695-4000-9
Publisher:IEEE Computer Society Press
Keywords

Hardware/software co-design; ASIP; Architecture description language; Cycle accurate interpreted simulation; Formal models.

Annotation

The area of hardware/software co-design deals with the design of ASIPs(Application Specific Instruction-set Processors) because they often create the core of an embedded system. Embedded systems with ASIPs are designed for a given task and they have to fulfill several criteria, such as power consumption, chip size, etc. The success of the design phase is closely related to the existence of good design tools, i.e. tools for ASIP programming and simulation. The simulation itself is very important, because with it we can verify and validate an ASIP design. For this purpose, ASIPs are described using an architecture description language that allows generating the design tools in an automatic way. In this article, we focus on presenting the principles which are used in our fast cycle-accurate interpreted simulator. Beside the simulation speed, we also focus on equivalence assurance between an ASIP simulator and its hardware realization.

BibTeX:
@INPROCEEDINGS{
   author = {Zdeněk Přikryl and Karel Masařík and Tomáš Hruška and Adam
	Husár},
   title = {Fast Cycle-Accurate Interpreted Simulation},
   pages = {9--14},
   booktitle = {Tenth International Workshop on Microprocessor Test and
	Verification: Common Challenges and Solutions},
   year = {2009},
   location = {Austin, US},
   publisher = {IEEE Computer Society Press},
   ISBN = {978-0-7695-4000-9},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=9181}
}

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