Bachelor's Theses

Year: Supervisor: 
Student:  Title: 
Keywords: 

Real-Time Displaying Quality Maps of Silicon Wafers

Ac. year:2012/2013
Student:Mareček Matěj
Supervisor:Herout Adam, prof. Ing., Ph.D.
Reviewer:Přibyl Bronislav, Ing.
Department:Department of Computer Graphics and Multimedia FIT BUT
Branch of study:Information Technology - BIT (Bachelor)
Language:czech
Status:defended - final grade A
Date:2013-06-11
Files:
Keywords
Silicon wafers, real-time displaying, JavaFX 2.2, graphical user interface, server, parallelism
Abstract
The goal of this bachelor's thesis is to design and implement a software system that can collect real-time data from measurements of silicon wafers. There could be tens or hundreds data sources of measurements and data from these measurements can be rendered (also in real time). This work contains a description of the process of manufacturing and testing of integrated circuits. Subsequently, there is description of system architecture design, interior architecture of real-time server and GUI of client application. In the last section, there is shown how rendering of silicon wafers was implemented on platform JavaFX 2.2 and also implementation of hybrid multi-threading server architecture.
ISO 690 Citation
MAREČEK, Matěj. Real-Time Displaying Quality Maps of Silicon Wafers. Brno, 2013. Available from: http://www.fit.vutbr.cz/study/DP/BP.php?id=14875. Bachelor's Thesis. Brno University of Technology, Faculty of Information Technology. 2013-06-11. Supervisor Herout Adam.
BibTeX
@MASTERSTHESIS{
    author = {Mat{\v{e}}j Mare{\v{c}}ek},
    type = {Bachelor's thesis},
    title = {Real-Time Displaying Quality Maps of Silicon
	Wafers},
    school = {Brno University of Technology,
		Faculty of Information Technology},
    year = {2013},
    location = {Brno, CZ},
    language = {czech},
    url = {http://www.fit.vutbr.cz/study/DP/BP.php?id=14875}
}

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