Thesis Details
Zobrazování map kvality křemíkových plátů v reálném čase
The goal of this bachelor's thesis is to design and implement a software system that can collect real-time data from measurements of silicon wafers. There could be tens or hundreds data sources of measurements and data from these measurements can be rendered (also in real time). This work contains a description of the process of manufacturing and testing of integrated circuits. Subsequently, there is description of system architecture design, interior architecture of real-time server and GUI of client application. In the last section, there is shown how rendering of silicon wafers was implemented on platform JavaFX 2.2 and also implementation of hybrid multi-threading server architecture.
Silicon wafers, real-time displaying, JavaFX 2.2, graphical user interface, server, parallelism
Beran Vítězslav, doc. Ing., Ph.D. (DCGM FIT BUT), člen
Holík Lukáš, doc. Mgr., Ph.D. (DITS FIT BUT), člen
Kreslíková Jitka, doc. RNDr., CSc. (DIFS FIT BUT), člen
Strnadel Josef, Ing., Ph.D. (DCSY FIT BUT), člen
@bachelorsthesis{FITBT14875, author = "Mat\v{e}j Mare\v{c}ek", type = "Bachelor's thesis", title = "Zobrazov\'{a}n\'{i} map kvality k\v{r}em\'{i}kov\'{y}ch pl\'{a}t\r{u} v re\'{a}ln\'{e}m \v{c}ase", school = "Brno University of Technology, Faculty of Information Technology", year = 2013, location = "Brno, CZ", language = "czech", url = "https://www.fit.vut.cz/study/thesis/14875/" }