Publication Details

Partial Scan Methodologoies

KOTÁSEK Zdeněk. Survey of Partial Scan Methodologies. In: Research and Training Action for System on Chip Design, 5th FP Project. Bratislava: Slovak Academy of Science, 2004, p. 77.

Czech title

Přehled metodik typu Partial Scan

Type

conference paper

Language

english

Authors

Kotásek Zdeněk, Doc. Ing., CSc. (DCSE FEECS BUT)

Keywords

digital circuit testability, test application

Abstract

Partial scan methodologies are seen as an alternative to applying a test to a digital circuit. In the presentation a survey of the methodologies is given.

Published

2004

Pages

Proceedings

Research and Training Action for System on Chip Design, 5th FP Project

Conference

Additional Hardware for IC Testability Improvement, Stará Lesná, SK

Publisher

Slovak Academy of Science

Place

Bratislava, SK

BibTeX

@INPROCEEDINGS{FITPUB7623,
   author = "Zden\v{e}k Kot\'{a}sek",
   title = "Partial Scan Methodologoies",
   pages = 77,
   booktitle = "Research and Training Action for System on Chip Design, 5th FP Project",
   year = 2004,
   location = "Bratislava, SK",
   publisher = "Slovak Academy of Science",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7623"
}