FITTest_BENCH06 Benchmarks & Cirgen
FITTest_BENCH06
The set consists of 31 circuits at various levels of complexity
(2000, 10000, 28000, 100000, 150000 and 300000 gates). Four circuits
with different diagnostic properties are available for each level of
circuit complexity (fault coverage is approx. 0%, 33%, 66% and 100%).
The benchmark circuits are available both at the register transfer level
and the gate level.
What is cirgen?
Cirgen is RTL (Register Transfer level) benchmark circuit
generator. It utilizes an evolutionary algorithm to design a structure of
a benchmark circuits automatically according to the testability
requirements specified by the user.
More information about cirgen
|
EH'05
contribution - The 2005 NASA/DoD Conference on Evolvable Hardware
(pdf, ps)
|
|
ETS'04
contribution - 9th IEEE European Test Symposium
(pdf, ps)
|
Download
FITTest_BENCH06
Download all circuits (VHDL, Verilog, EDIF) in one archive 16,6MB
FITTest_BENCH06(a)
Variable complexity/variable diagnostic properties - 20 circuits with 5
levels of complexity - 2000, 10000, 28000, 150000 and 300000 gates. For each
level of complexity, circuits at four levels of diagnostic properties exist
(fault coverage approx. 0%; 33%, 66% and 100%).
- e01 -
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Simple easy testable circuit - consists of 5xADD(16bit), 5xSUB(16bit),
5xMUX2(16bit) components and 5 primary inputs and outputs.
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Information & download
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PI |
PO |
Gates |
FF |
86 |
80 |
1985 |
160 |
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Circuit structrure (TSMC elements)
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Type of comp. |
and02 |
ao21 |
ao22 |
ao221 |
aoi21 |
aoi22 |
aoi221 |
aoi32 |
aoi322 |
aoi332 |
# of comp. |
4 |
48 |
1 |
1 |
2 |
61 |
1 |
4 |
1 |
1 |
|
Type of comp. |
aoi332 |
buf04 |
buf16 |
dff |
inv01 |
inv02 |
mux21 |
nand02 |
nand03 |
nor02 |
# of comp. |
1 |
14 |
11 |
160 |
7 |
144 |
79 |
6 |
1 |
49 |
|
Type of comp. |
nor02 |
oai21 |
oai22 |
oai221 |
oai222 |
oai32 |
oai33 |
or02 |
xnor2 |
xor2 |
# of comp. |
49 |
6 |
47 |
4 |
1 |
1 |
1 |
2 |
201 |
95 |
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Testability results by FlexTest
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  |
Uncollapsed |
Collapsed |
Fault coverage
| 90.45%
| 86.83%
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Test coverage
| 94.95%
| 92.89%
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ATPG effectiveness
| 99.97%
| 99.96%
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- e02 -
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Simple circuit - consists of 5xADD(16bit), 5xSUB(16bit), 5xMUX2(16bit)
components and 5 primary inputs and outputs.
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Information & download
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|
PI |
PO |
Gates |
FF |
86 |
80 |
1657 |
144 |
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Circuit structrure (TSMC elements)
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|
Type of comp. |
and02 |
ao21 |
ao32 |
aoi22 |
aoi222 |
aoi32 |
dff |
inv02 |
mux21 |
nand02 |
# of comp. |
4 |
42 |
16 |
59 |
16 |
4 |
144 |
100 |
21 |
6 |
|
Type of comp. |
nand02 |
nor02 |
oai21 |
oai22 |
xnor2 |
xor2 |
# of comp. |
6 |
34 |
2 |
35 |
164 |
110 |
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Testability results by FlexTest
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  |
Uncollapsed |
Collapsed |
Fault coverage
| 60.69%
| 58.94%
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Test coverage
| 63.37%
| 62.52%
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ATPG effectiveness
| 99.88%
| 99.88%
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- e03 -
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Simple circuit - consists of 5xADD(16bit), 5xSUB(16bit), 5xMUX2(16bit)
components and 5 primary inputs and outputs.
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Information & download
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PI |
PO |
Gates |
FF |
86 |
80 |
2046 |
160 |
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Circuit structrure (TSMC elements)
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Type of comp. |
and02 |
and04 |
ao21 |
ao22 |
ao32 |
aoi21 |
aoi22 |
aoi221 |
aoi222 |
aoi32 |
# of comp. |
11 |
1 |
30 |
2 |
9 |
5 |
64 |
1 |
6 |
7 |
|
Type of comp. |
aoi32 |
aoi321 |
aoi322 |
aoi33 |
aoi332 |
buf04 |
buf16 |
dff |
inv01 |
inv02 |
# of comp. |
7 |
2 |
1 |
2 |
1 |
12 |
20 |
160 |
28 |
120 |
|
Type of comp. |
inv02 |
mux21 |
nand02 |
nand03 |
nor02 |
nor03 |
oai21 |
oai22 |
oai222 |
oai32 |
# of comp. |
120 |
68 |
19 |
8 |
31 |
5 |
9 |
46 |
1 |
3 |
|
Type of comp. |
oai32 |
oai33 |
oai332 |
or02 |
or03 |
xnor2 |
xor2 |
# of comp. |
3 |
4 |
1 |
3 |
1 |
173 |
120 |
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Testability results by FlexTest
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  |
Uncollapsed |
Collapsed |
Fault coverage
| 39.43%
| 39.43%
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Test coverage
| 41.56%
| 42.15%
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ATPG effectiveness
| 99.51%
| 99.52%
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- e04 -
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Simple hard to test circuit - consists of 5xADD(16bit), 5xSUB(16bit),
5xMUX2(16bit) components and 5 primary inputs and outputs.
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Information & download
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PI |
PO |
Gates |
FF |
86 |
80 |
2221 |
160 |
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Circuit structrure (TSMC elements)
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Type of comp. |
and02 |
ao21 |
ao22 |
aoi21 |
aoi22 |
aoi221 |
aoi222 |
aoi32 |
aoi33 |
aoi332 |
# of comp. |
16 |
25 |
3 |
14 |
83 |
12 |
1 |
4 |
3 |
1 |
|
Type of comp. |
aoi332 |
buf04 |
buf16 |
dff |
inv01 |
inv02 |
mux21 |
nand02 |
nand03 |
nor02 |
# of comp. |
1 |
18 |
34 |
160 |
38 |
167 |
107 |
13 |
1 |
48 |
|
Type of comp. |
nor02 |
nor03 |
oai21 |
oai22 |
oai221 |
oai32 |
oai321 |
oai33 |
oai332 |
oai43 |
# of comp. |
48 |
3 |
6 |
49 |
3 |
4 |
3 |
4 |
1 |
1 |
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Type of comp. |
oai43 |
or02 |
or03 |
xnor2 |
xor2 |
# of comp. |
1 |
8 |
1 |
186 |
91 |
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Testability results by FlexTest
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  |
Uncollapsed |
Collapsed |
Fault coverage
| 0.00%
| 0.00%
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Test coverage
| 0.00%
| 0.00%
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ATPG effectiveness
| 100.00%
| 100.00%
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- e05 -
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Easy testable circuit - consists of 25xADD(16bit), 25xSUB(16bit),
25xMUX2(16bit) components and 10 primary inputs and outputs.
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Information & download
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PI |
PO |
Gates |
FF |
186 |
160 |
10011 |
792 |
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Circuit structrure (TSMC elements)
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Type of comp. |
and02 |
and03 |
ao21 |
ao22 |
ao32 |
aoi21 |
aoi22 |
aoi221 |
aoi222 |
aoi32 |
# of comp. |
52 |
5 |
202 |
8 |
3 |
14 |
262 |
5 |
1 |
18 |
|
Type of comp. |
aoi32 |
aoi321 |
aoi322 |
aoi33 |
aoi332 |
aoi422 |
aoi43 |
buf02 |
buf04 |
buf16 |
# of comp. |
18 |
4 |
4 |
7 |
14 |
1 |
1 |
27 |
48 |
82 |
|
Type of comp. |
buf16 |
dff |
inv01 |
inv02 |
mux21 |
nand02 |
nand03 |
nand04 |
nor02 |
nor03 |
# of comp. |
82 |
792 |
157 |
498 |
472 |
55 |
16 |
16 |
200 |
2 |
|
Type of comp. |
nor03 |
nor04 |
oai21 |
oai22 |
oai221 |
oai222 |
oai32 |
oai321 |
oai322 |
oai33 |
# of comp. |
2 |
1 |
26 |
179 |
4 |
7 |
20 |
10 |
3 |
2 |
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Type of comp. |
oai33 |
oai332 |
oai422 |
or02 |
or03 |
or04 |
xnor2 |
xor2 |
# of comp. |
2 |
9 |
1 |
9 |
3 |
1 |
862 |
600 |
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Testability results by FlexTest
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  |
Uncollapsed |
Collapsed |
Fault coverage
| 90.11%
| 86.81%
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Test coverage
| 94.73%
| 92.84%
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ATPG effectiveness
| 99.77%
| 99.74%
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- e06 -
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Circuit with average testability. The circuit consists of 25xADD(16bit),
25xSUB(16bit), 25xMUX2(16bit) components and 10 primary inputs and outputs.
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Information & download
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PI |
PO |
Gates |
FF |
186 |
160 |
9999 |
831 |
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Circuit structrure (TSMC elements)
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Type of comp. |
and02 |
and03 |
ao21 |
ao22 |
ao221 |
ao32 |
aoi21 |
aoi22 |
aoi221 |
aoi222 |
# of comp. |
49 |
5 |
182 |
13 |
5 |
5 |
27 |
292 |
4 |
6 |
|
Type of comp. |
aoi222 |
aoi32 |
aoi321 |
aoi322 |
aoi332 |
buf04 |
buf16 |
dff |
inv01 |
inv02 |
# of comp. |
6 |
20 |
6 |
3 |
7 |
39 |
22 |
831 |
142 |
449 |
|
Type of comp. |
inv02 |
mux21 |
nand02 |
nand03 |
nand04 |
nor02 |
nor03 |
oai21 |
oai22 |
oai221 |
# of comp. |
449 |
444 |
47 |
6 |
4 |
205 |
7 |
26 |
210 |
1 |
|
Type of comp. |
oai221 |
oai222 |
oai32 |
oai321 |
oai322 |
oai33 |
oai332 |
oai43 |
oai44 |
or02 |
# of comp. |
1 |
5 |
15 |
5 |
2 |
4 |
13 |
1 |
1 |
11 |
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Testability results by FlexTest
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  |
Uncollapsed |
Collapsed |
Fault coverage
| 43.90%
| 41.74%
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Test coverage
| 45.78%
| 44.14%
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ATPG effectiveness
| 95.62%
| 96.17%
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- e07 -
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Circuit with average testability. The circuit consists of 25xADD(16bit),
25xSUB(16bit), 25xMUX2(16bit) components and 10 primary inputs and outputs.
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Information & download
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PI |
PO |
Gates |
FF |
186 |
160 |
9894 |
785 |
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Circuit structrure (TSMC elements)
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Type of comp. |
and02 |
and03 |
ao21 |
ao22 |
ao221 |
ao32 |
aoi21 |
aoi22 |
aoi221 |
aoi222 |
# of comp. |
53 |
2 |
207 |
15 |
3 |
4 |
32 |
322 |
10 |
1 |
|
Type of comp. |
aoi222 |
aoi32 |
aoi321 |
aoi322 |
aoi332 |
aoi422 |
buf04 |
buf16 |
dff |
inv01 |
# of comp. |
1 |
23 |
3 |
3 |
3 |
1 |
44 |
30 |
785 |
124 |
|
Type of comp. |
inv01 |
inv02 |
mux21 |
nand02 |
nand03 |
nand04 |
nor02 |
nor03 |
oai21 |
oai22 |
# of comp. |
124 |
558 |
424 |
40 |
9 |
3 |
242 |
2 |
25 |
199 |
|
Type of comp. |
oai22 |
oai221 |
oai222 |
oai32 |
oai321 |
oai322 |
oai332 |
or02 |
or03 |
or04 |
# of comp. |
199 |
10 |
1 |
14 |
6 |
6 |
6 |
26 |
6 |
1 |
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Testability results by FlexTest
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  |
Uncollapsed |
Collapsed |
Fault coverage
| 22.87%
| 21.36%
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Test coverage
| 23.79%
| 22.49%
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ATPG effectiveness
| 85.95%
| 86.01%
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- e08 -
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Circuit with low testability. The circuit consists of 25xADD(16bit),
25xSUB(16bit), 25xMUX2(16bit) components and 10 primary inputs and outputs.
|
Information & download
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|
PI |
PO |
Gates |
FF |
186 |
160 |
9559 |
778 |
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Circuit structrure (TSMC elements)
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Type of comp. |
and02 |
and03 |
and04 |
ao21 |
ao22 |
ao221 |
ao32 |
aoi21 |
aoi22 |
aoi221 |
# of comp. |
34 |
1 |
1 |
141 |
10 |
2 |
2 |
26 |
300 |
9 |
|
Type of comp. |
aoi221 |
aoi222 |
aoi32 |
aoi321 |
aoi322 |
aoi33 |
aoi332 |
buf02 |
buf04 |
buf16 |
# of comp. |
9 |
4 |
12 |
2 |
1 |
1 |
4 |
19 |
25 |
24 |
|
Type of comp. |
buf16 |
dff |
inv01 |
inv02 |
mux21 |
nand02 |
nand03 |
nor02 |
oai21 |
oai22 |
# of comp. |
24 |
778 |
81 |
473 |
474 |
31 |
3 |
153 |
18 |
219 |
|
Type of comp. |
oai22 |
oai221 |
oai32 |
oai321 |
oai322 |
oai33 |
oai332 |
oai422 |
oai43 |
oai44 |
# of comp. |
219 |
10 |
11 |
4 |
1 |
3 |
6 |
1 |
1 |
1 |
|
Type of comp. |
oai44 |
or02 |
or03 |
xnor2 |
xor2 |
# of comp. |
1 |
12 |
3 |
840 |
649 |
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Testability results by FlexTest
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  |
Uncollapsed |
Collapsed |
Fault coverage
| 0.00%
| 0.00%
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Test coverage
| 0.00%
| 0.00%
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ATPG effectiveness
| 96.33%
| 96.65%
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- e09 -
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Circuit with high testability. The circuit consist of 25xADD(8),
25xSUB(8), 25xMUX2(8), 25xADD(16), 25xSUB(16), 25xMUX2(16), 25xMUL(16)
components and 15 primary inputs and outputs.
|
Information & download
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PI |
PO |
Gates |
FF |
211 |
192 |
28065 |
2020 |
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Circuit structrure (TSMC elements)
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Type of comp. |
and02 |
and04 |
ao21 |
ao22 |
aoi21 |
aoi22 |
aoi32 |
buf02 |
buf04 |
dff |
# of comp. |
21 |
40 |
329 |
3 |
6 |
619 |
33 |
38 |
96 |
2020 |
|
Type of comp. |
dff |
inv02 |
mux21 |
nand02 |
nand04 |
nor02 |
nor04 |
oai21 |
oai22 |
oai32 |
# of comp. |
2020 |
1650 |
2110 |
924 |
65 |
714 |
130 |
29 |
196 |
17 |
|
Type of comp. |
oai32 |
or02 |
xnor2 |
xor2 |
# of comp. |
17 |
96 |
3551 |
1116 |
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Testability results by FlexTest
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  |
Uncollapsed |
Collapsed |
Fault coverage
| 91.90%
| 89.52%
|
Test coverage
| 95.43%
| 94.03%
|
ATPG effectiveness
| 99.94%
| 99.93%
|
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- e10 -
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Circuit with average testability. The circuit consist of 25xADD(8),
25xSUB(8), 25xMUX2(8), 25xADD(16), 25xSUB(16), 25xMUX2(16), 25xMUL(16)
components and 15 primary inputs and outputs.
|
Information & download
|
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|
PI |
PO |
Gates |
FF |
179 |
208 |
27853 |
1979 |
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Circuit structrure (TSMC elements)
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Type of comp. |
and02 |
and03 |
and04 |
ao21 |
ao22 |
aoi21 |
aoi22 |
aoi32 |
aoi321 |
aoi322 |
# of comp. |
25 |
1 |
42 |
364 |
14 |
19 |
579 |
23 |
1 |
1 |
|
Type of comp. |
aoi322 |
aoi332 |
aoi43 |
buf02 |
buf04 |
buf16 |
dff |
inv01 |
inv02 |
mux21 |
# of comp. |
1 |
2 |
2 |
37 |
77 |
8 |
1979 |
27 |
1528 |
2102 |
|
Type of comp. |
mux21 |
nand02 |
nand03 |
nand04 |
nor02 |
nor03 |
nor04 |
oai21 |
oai22 |
oai32 |
# of comp. |
2102 |
999 |
1 |
61 |
742 |
1 |
132 |
33 |
193 |
14 |
|
Type of comp. |
oai32 |
oai33 |
oai332 |
oai43 |
or02 |
xnor2 |
xor2 |
# of comp. |
14 |
2 |
2 |
2 |
27 |
3499 |
1175 |
|
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Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 64.22%
| 62.89%
|
Test coverage
| 66.53%
| 65.87%
|
ATPG effectiveness
| 83.50%
| 84.01%
|
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- e11 -
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Circuit with average testability. The circuit consist of 25xADD(8),
25xSUB(8), 25xMUX2(8), 25xADD(16), 25xSUB(16), 25xMUX2(16), 25xMUL(16)
components and 15 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
211 |
200 |
28231 |
2058 |
|
|
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Circuit structrure (TSMC elements)
|
|
Type of comp. |
and02 |
and03 |
and04 |
ao21 |
ao22 |
aoi21 |
aoi22 |
aoi32 |
aoi321 |
aoi322 |
# of comp. |
35 |
7 |
38 |
340 |
13 |
28 |
576 |
25 |
7 |
6 |
|
Type of comp. |
aoi322 |
aoi33 |
aoi332 |
aoi43 |
buf02 |
buf04 |
buf16 |
dff |
inv01 |
inv02 |
# of comp. |
6 |
4 |
6 |
1 |
37 |
86 |
18 |
2058 |
103 |
1489 |
|
Type of comp. |
inv02 |
mux21 |
nand02 |
nand03 |
nand04 |
nor02 |
nor03 |
nor04 |
oai21 |
oai22 |
# of comp. |
1489 |
1944 |
953 |
12 |
60 |
798 |
7 |
140 |
43 |
247 |
|
Type of comp. |
oai22 |
oai221 |
oai222 |
oai32 |
oai321 |
oai322 |
oai332 |
or02 |
or03 |
xnor2 |
# of comp. |
247 |
1 |
2 |
32 |
5 |
1 |
16 |
75 |
2 |
3487 |
|
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Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 27.46%
| 27.50%
|
Test coverage
| 28.45%
| 28.82%
|
ATPG effectiveness
| 83.68%
| 84.41%
|
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- e12 -
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Circuit with low testability. The circuit consist of 25xADD(8),
25xSUB(8), 25xMUX2(8), 25xADD(16), 25xSUB(16), 25xMUX2(16), 25xMUL(16)
components and 15 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
203 |
208 |
28438 |
2106 |
|
|
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Circuit structrure (TSMC elements)
|
|
Type of comp. |
and02 |
and03 |
and04 |
ao21 |
ao32 |
aoi21 |
aoi22 |
aoi222 |
aoi32 |
aoi321 |
# of comp. |
16 |
1 |
33 |
284 |
1 |
21 |
589 |
1 |
35 |
3 |
|
Type of comp. |
aoi321 |
aoi322 |
aoi332 |
buf02 |
buf04 |
buf16 |
dff |
inv01 |
inv02 |
mux21 |
# of comp. |
3 |
2 |
4 |
51 |
95 |
14 |
2106 |
90 |
1479 |
2100 |
|
Type of comp. |
mux21 |
nand02 |
nand03 |
nand04 |
nor02 |
nor03 |
nor04 |
oai21 |
oai22 |
oai221 |
# of comp. |
2100 |
888 |
8 |
57 |
829 |
1 |
136 |
32 |
196 |
1 |
|
Type of comp. |
oai221 |
oai32 |
oai321 |
oai332 |
oai43 |
or02 |
xnor2 |
xor2 |
# of comp. |
1 |
22 |
2 |
4 |
2 |
55 |
3513 |
1145 |
|
|
Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 0.00%
| 0.00%
|
Test coverage
| 0.00%
| 0.00%
|
ATPG effectiveness
| 96.63%
| 96.63%
|
|
|
|
- e13 -
|
|
Circuit with high testability. The circuit consist of 50xADD(16),
50xSUB(16), 50xMUX2(16), 50xADD(32), 50xSUB(32), 50xMUX2(32),
50xMUL(16,32) components and 75 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
1669 |
1904 |
155046 |
6304 |
|
|
|
Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 89.38%
| n/a
|
Test coverage
| 93.33%
| n/a
|
ATPG effectiveness
| 96.27%
| n/a
|
|
|
|
- e14 -
|
|
Circuit with medium testability. The circuit consist of 50xADD(16),
50xSUB(16), 50xMUX2(16), 50xADD(32), 50xSUB(32), 50xMUX2(32),
50xMUL(16,32) components and 75 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
1621 |
1904 |
155380 |
6368 |
|
|
|
Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 64.46%
| n/a
|
Test coverage
| 67.29%
| n/a
|
ATPG effectiveness
| 74.39%
| n/a
|
|
|
|
- e15 -
|
|
Circuit with medium testability. The circuit consist of 50xADD(16),
50xSUB(16), 50xMUX2(16), 50xADD(32), 50xSUB(32), 50xMUX2(32),
50xMUL(16,32) components and 75 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
1701 |
1840 |
155207 |
6368 |
|
|
|
Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 31.84%
| n/a
|
Test coverage
| 33.24%
| n/a
|
ATPG effectiveness
| 44.28%
| n/a
|
|
|
|
- e16 -
|
|
Circuit with low testability. The circuit consist of 50xADD(16),
50xSUB(16), 50xMUX2(16), 50xADD(32), 50xSUB(32), 50xMUX2(32),
50xMUL(16,32) components and 75 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
1589 |
1744 |
155045 |
6368 |
|
|
|
Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 12.50%
| n/a
|
Test coverage
| 13.05%
| n/a
|
ATPG effectiveness
| 38.18%
| n/a
|
|
|
|
- e17 -
|
|
Circuit with high testability. The circuit consist of 100xADD(16),
100xSUB(16), 100xMUX2(16), 100xADD(32), 100xSUB(32), 100xMUX2(32),
100xMUL(16,32) components and 180 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
3833 |
4272 |
310122 |
12672 |
|
|
|
Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 81.73%
| n/a
|
Test coverage
| 85.32%
| n/a
|
ATPG effectiveness
| 87.81%
| n/a
|
|
|
|
- e18 -
|
|
Circuit with medium testability. The circuit consist of 100xADD(16),
100xSUB(16), 100xMUX2(16), 100xADD(32), 100xSUB(32), 100xMUX2(32),
100xMUL(16,32) components and 180 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
3913 |
4512 |
309856 |
12608 |
|
|
|
Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 56.72%
| n/a
|
Test coverage
| 58.78%
| n/a
|
ATPG effectiveness
| 62.12%
| n/a
|
|
|
|
- e19 -
|
|
Circuit with medium testability. The circuit consist of 100xADD(16),
100xSUB(16), 100xMUX2(16), 100xADD(32), 100xSUB(32), 100xMUX2(32),
100xMUL(16,32) components and 180 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
3833 |
4320 |
309874 |
12576 |
|
|
|
Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 40.28%
| n/a
|
Test coverage
| 42.05%
| n/a
|
ATPG effectiveness
| 59.24%
| n/a
|
|
|
|
- e20 -
|
|
Circuit with low testability. The circuit consist of 100xADD(16),
100xSUB(16), 100xMUX2(16), 100xADD(32), 100xSUB(32), 100xMUX2(32),
100xMUL(16,32) components and 180 primary inputs and outputs.
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
3961 |
4352 |
310610 |
12736 |
|
|
|
Testability results by FlexTest
|
|
  |
Uncollapsed |
Collapsed |
Fault coverage
| 23.13%
| n/a
|
Test coverage
| 24.14%
| n/a
|
ATPG effectiveness
| 46.07%
| n/a
|
|
|
|
FITTest_BENCH06(b)
Constant complexity/variable diagnostic properties - 11 synthetic
benchmarks with identical complexity but different diagnostic properties. All
eleven circuits have 35 primary inputs, 35 primary outputs and consist of
35x16-bit adders, 35x16-bit subtractors, 35x16-bit multiplexers, 35x32-bit
adders, 35x32-bit subtractors, 35x32-bit multiplexers, 35x16/32 multipliers and
175x(16/32)-bit registers. For each circuit, different controllability and
observability is available in range from 0% to 100%.
- a01 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
839 |
880 |
108748 |
4448 |
|
|
|
|
|
- a02 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
775 |
816 |
108532 |
4416 |
|
|
|
|
|
- a03 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
775 |
912 |
108876 |
4448 |
|
|
|
|
|
- a04 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
791 |
912 |
108551 |
4416 |
|
|
|
|
|
- a05 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
775 |
848 |
108740 |
4448 |
|
|
|
|
|
- a06 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
775 |
896 |
108607 |
4416 |
|
|
|
|
|
- a07 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
743 |
848 |
108811 |
4448 |
|
|
|
|
|
- a08 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
839 |
992 |
108650 |
4448 |
|
|
|
|
|
- a09 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
743 |
944 |
108345 |
4384 |
|
|
|
|
|
- a10 -
|
|
|
Information & download
|
|
|
PI |
PO |
Gates |
FF |
775 |
832 |
108652 |
4448 |
|
|
|
|
|
Old circuits
Benchmark set |
Description |
Circuits consist of 5xADD(8), 5xSUB(8), 5xMUX2(8), 5 primary inputs and
outputs. Each set contains 10 circuits.
|
circuits_a01.zip |
testability: high (controllability~90%, observability~90%) |
circuits_a02.zip |
testability: medium (controllability~50%, observability~50%) |
circuits_a03.zip |
testability: low (controllability~10%, observability~10%) |
Circuits consist of 25xADD(8), 25xSUB(8), 25xMUX2(8), 10 primary inputs and
outputs. Each set contains 10 circuits.
|
circuits_b01.zip |
testability: high (controllability~90%, observability~90%) |
circuits_b02.zip |
testability: medium (controllability~50%, observability~50%) |
circuits_b03.zip |
testability: low (controllability~10%, observability~10%) |
Circuits consist of 25xADD(8), 25xSUB(8), 25xMUX2(8),
25xADD(16), 25xSUB(16), 25xMUX2(16), 25xMUL(16), 15 primary inputs and
outputs. Each set contains 10 circuits.
|
circuits_c01.zip |
testability: high (controllability~90%, observability~90%) |
circuits_c02.zip |
testability: medium (controllability~50%, observability~50%) |
circuits_c03.zip |
testability: low (controllability~10%, observability~10%) |
|