Detail publikace

IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

SEKANINA Lukáš, FEY Görschwin, RAIK Jaan, AUNET Snorre a RŮŽIČKA Richard, ed. IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Brno: IEEE Computer Society, 2013. ISBN 978-1-4673-6133-0.
Typ
konferenční sborník
Jazyk
angličtina
Autoři
Sekanina Lukáš, prof. Ing., Ph.D. (UPSY FIT VUT)
Fey Görschwin (UNIBRE)
Raik Jaan (TTÜ)
Aunet Snorre (NTNU)
Růžička Richard, doc. Ing., Ph.D., MBA (UPSY FIT VUT)
Rok
2013
Strany
300
Konference
IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2013, Karlovy Vary, CZ
ISBN
978-1-4673-6133-0
Vydavatel
IEEE Computer Society
Místo
Brno, CZ
BibTeX 
@PROCEEDINGS{FITPUB10336,
   editor = "Luk\'{a}\v{s} Sekanina and G{\"{o}}rschwin Fey and Jaan Raik and Snorre Aunet and Richard R\r{u}\v{z}i\v{c}ka",
   title = "IEEE 16th International Symposium on Design and Diagnostics of  Electronic Circuits \& Systems",
   pages = 300,
   year = 2013,
   location = "Brno, CZ",
   publisher = "IEEE Computer Society",
   ISBN = "978-1-4673-6133-0",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/10336"
}
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