Prof. Ing. Lukáš Sekanina, Ph.D.

RŮŽIČKA Richard, ŠIMEK Václav and SEKANINA Lukáš. Behavior of CMOS Polymorphic Circuits in High Temperature Environment. In: Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems. Cottbus: IEEE Computer Society, 2011, pp. 447-452. ISBN 978-1-4244-9753-9.
Publication language:english
Original title:Behavior of CMOS Polymorphic Circuits in High Temperature Environment
Title (cs):Chování polymorfních obvodů CMOS při vysokých teplotách
Pages:447-452
Proceedings:Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
Conference:IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2011
Place:Cottbus, DE
Year:2011
ISBN:978-1-4244-9753-9
Publisher:IEEE Computer Society
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Keywords
Polymorphic digital circuits, polymorphic gates, reconfigurable circuits, temperature-aware design.
Annotation
The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 which is configured (in addition to the configuration bit stream) using the level of power supply voltage (Vdd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by Vdd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature.
BibTeX:
@INPROCEEDINGS{
   author = {Richard R{\r{u}}{\v{z}}i{\v{c}}ka and V{\'{a}}clav
	{\v{S}}imek and Luk{\'{a}}{\v{s}} Sekanina},
   title = {Behavior of CMOS Polymorphic Circuits in High Temperature
	Environment},
   pages = {447--452},
   booktitle = {Proceedings of the 2011 IEEE Symposium on Design and
	Diagnostics of Electronic Circuits and Systems},
   year = {2011},
   location = {Cottbus, DE},
   publisher = {IEEE Computer Society},
   ISBN = {978-1-4244-9753-9},
   language = {english},
   url = {http://www.fit.vutbr.cz/research/view_pub.php?id=9581}
}

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