permfind

This tool simultaneously optimizes the ordering of test vectors and scan cells in full scan chain (if any) to reduce power consumption during the test application. For the optimiazation the genetic algorithm is used. The tool implements algorithms from my PhD thesis (in Czech). The tool also includes the power consumption simulator.

Examples of usage:

permfind FCIRC FLIB.xml FVEC.fault
pwrest -t w FCIRC FLIB.xml FVEC.fault

In the first example the test is optimized for lowest NTC metric. In the second example the test is optimized for lowest WSA metric. The WNTC metric and Hamming distance between test vectors are also supported. The FCIRC is base name of Zboril's binary files (without suffixes) that describe the circuit. Combinatorial or full scan sequentional circuits are supported. The FLIB.xml is XML library that describes the properties of used circuit elements. The FVEC.fault is Mentor Graphics's Flextest ASCII test vectors file that describes the test.

For the power consumption estimation during the optimization process the XML library is needed. You can create one for your technology (the XML schema is provided) or you can compile the library for the AMI technology from the public available data on the internet. The Perl script named ami2xml can be used for this purpose. It downloads all needed data from the third party WWW pages and compiles the data into XML library in proper format. The script was tested to work in January 2009. The script is provided in the contrib directory of the source code package. This solution was selected in order not to violate any copyrights.

This utility supports many various modes and options. For complete up-to-date reference see the built-in help with following command:

permfind --help

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Last modification:  2009-11-27