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Publications
2008
- Strnadel, J.: TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path. In: Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools, Los Alamitos, US, IEEE CS, 2008, p. 865-872, ISBN 978-0-7695-3277-6
- Strnadel Josef, Pečenka Tomáš, Kotásek Zdeněk: Measuring Design for Testability Tool Effectiveness by Means of FITTest_BENCH06 Benchmark Circuits, In: Computing and Informatics, Vol. 27, No. 6, 2008, Bratislava, SK, p. 913-930, ISSN 1335-9150
2007
- Strnadel, J.: Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis, In: Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference, Brno, CZ, VUT v Brně, 2007, pp. 333-338, ISBN 978-80-214-3470-7.
2006
- Kotásek, Z., Strnadel, J.: SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System, In: Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS), Los Alamitos, CA, US, IEEE CS, 2006, p. 497-498, ISBN 0-7695-2546-6.
- Strnadel, J.: Testability Analysis and Improvements of Register-Transfer Level Digital Circuits, In: Computing and Informatics, Vol. 25, No. 5, 2006, Bratislava, SK, pp. 441-464, ISSN 1335-9150
2005
- Kotásek, Z., Strnadel, J. et al: Testing Tools for Training and Education, In: Proceedings of 12th International Conference on Mixed Design of Integrated Circuits and Systems, Krakow, PL, DMCS-TUL, 2005, pp. 671-676, ISBN 83-919289-9-3.
- Strnadel, J., Kotásek, Z.: Educational Tool for the Demonstration of Dft Principles Based on Scan Methodologies, In: Proceedings of 8th Euromicro Conference on Digital System Design, Los Alamitos, US, IEEE CS, 2005, pp. 420-427, ISBN 0-7695-2433-8.
- Drábek, V., Kotásek, Z.: Handbook of Testing Electronic Systems, Praha, CZ, VCVUT, 2005, pp. 366-367, ISBN 80-01-03318-X.
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