Ing. Josef Strnadel, Ph.D.

2016STRNADEL Josef and RIŠA Michal. On Analysis of Software Interrupt Limiters for Embedded Systems by Means of UPPAAL SMC. In: Proceedings of the 24th Austrian Workshop on Microelectronics. Villach: IEEE Computer Society Press, 2016, pp. 45-50. ISBN 978-1-5090-1040-0.
 STRNADEL Josef. Souhrnná výzkumná zpráva k projektu Vývoj ovladače rekonfigurovatelné platformy pro FreeRTOS. Brno: RehiveTech, spol. s r.o., 2016.
 STRNADEL Josef. Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits. In: Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Bratislava: Slovak University of Technology in Bratislava, 2016, pp. 32-37. ISBN 978-80-8086-256-5.
 STRNADEL Josef. On Creation and Analysis of Reliability Models by Means of Stochastic Timed Automata and Statistical Model Checking: Principle. In: Leveraging Applications of Formal Methods, Verification and Validation: Foundational Techniques. Cham: Springer International Publishing, 2016, pp. 166-181. ISBN 978-3-319-47166-2. ISSN 0302-9743.
2015STRNADEL Josef. Souhrnná výzkumná zpráva k projektu Vývoj ovladače rekonfigurovatelné platformy pro FreeRTOS. Brno: RehiveTech, spol. s r.o., 2015.
 STRNADEL Josef. Comparison of Generally Applicable Mechanisms for Preventing Embedded Event-Driven Real-Time Systems from Interrupt Overloads. In: Proceedings of the 2015 4th Eastern European Regional Conference on the Engineering of Computer Based Systems. Brno: Brno University of Technology, 2015, pp. 39-44. ISBN 978-1-4673-7967-0.
2014STRNADEL Josef and CONTE Giuseppe. Producing Unique Identifiers and Random Numbers on Basis of Unclonable Parameters of Microcontrollers and Undesired Effects. In: Proceedings of Electronic Devices and Systems IMAPS CS International Conference 2014. Brno: Brno University of Technology, 2014, pp. 82-87. ISBN 978-80-214-4985-5.
 STRNADEL Josef and POKORNÝ Martin. Comparing Availability-Aware Real-Time Schedulers by Means of Configurable Experimental Framework. In: Proceedings of the 2014 17th Euromicro Conference on Digital System Design. Los Alamitos: IEEE Computer Society, 2014, pp. 333-340. ISBN 978-1-4799-5793-4.
 STRNADEL Josef and SLIMAŘÍK František. Impact of Software Fault Tolerance to Fault Effects in OS-Driven RT Systems. Computing and Informatics. Bratislava: Slovak Academic Press, 2014, vol. 33, no. 4, pp. 757-782. ISSN 1335-9150.
2013STRNADEL Josef. Load-Adaptive Monitor-Driven Hardware for Preventing Embedded Real-Time Systems from Overloads Caused by Excessive Interrupt Rates. In: Architecture of Computing Systems - ARCS 2013. Berlin: Springer Verlag, 2013, pp. 98-109. ISBN 978-3-642-36423-5. ISSN 0302-9743.
 STRNADEL Josef. On Design of Priority-Driven Load-Adaptive Monitoring-Based Hardware for Managing Interrupts in Embedded Event-Triggered Real-Time Systems. In: Proceedings of the IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Brno: IEEE Computer Society, 2013, pp. 24-29. ISBN 978-1-4673-6133-0.
 STRNADEL Josef. Plánování úloh v systémech RT - IV: víceprocesorové prostředí. Automa. 2013, vol. 19, no. 1, pp. 44-46. ISSN 1210-9592.
 STRNADEL Josef. Plánování úloh v systémech RT - V: zvyšování provozuschopnosti systémů. Automa. 2013, vol. 19, no. 2, pp. 46-49. ISSN 1210-9592.
2012STRNADEL Josef and RAJNOHA Peter. Reflecting RTOS Model During WCET Timing Analysis: MSP430/FreeRTOS Case Study. Acta Electrotechnica et Informatica. 2012, vol. 12, no. 4, pp. 17-29. ISSN 1335-8243.
 STRNADEL Josef and SLIMAŘÍK František. On Distribution and Impact of Fault Effects at Real-Time Kernel and Application Levels. In: Proceedings of the 15th Euromicro Conference on Digital System Design: Architectures, Methods and Tools. Pistacaway: IEEE Computer Society, 2012, pp. 272-279. ISBN 978-0-7695-4798-5.
 STRNADEL Josef. Monitoring-Driven HW/SW Interrupt Overload Prevention for Embedded Real-Time Systems. In: Proceedings of the 15th International IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Tallin: IEEE Computer Society, 2012, pp. 121-126. ISBN 978-1-4673-1188-5.
 STRNADEL Josef. Plánování úloh v systémech RT - I: závislé úlohy. Automa. 2012, vol. 18, no. 10, pp. 42-45. ISSN 1210-9592.
 STRNADEL Josef. Plánování úloh v systémech RT - II: neperiodické úlohy. Automa. 2012, vol. 18, no. 11, pp. 44-46. ISSN 1210-9592.
 STRNADEL Josef. Plánování úloh v systémech RT - III: přetížení systému. Automa. 2012, vol. 18, no. 12, pp. 44-47. ISSN 1210-9592.
2011RUMPLÍK Michal and STRNADEL Josef. On RTL Testability and Gate-Level Stuck-At-Fault Coverage Correlation for Scan Circuits. In: Proceedings of the 14th Euromicro Conference on Digital System Design - Architectures, Methods and Tools 2011. Oulu: IEEE Computer Society, 2011, pp. 367-374. ISBN 978-0-7695-4494-6.
 STRNADEL Josef. Concept of Adaptive Embedded HW/SW Architecture for Dynamic Prevention from Interrupt Overloads. In: Proceedings of the Work in Progress Session held in connection with SEAA 2011, the 37th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2011, the 14th EUROMICRO Conference on Digital System Design. Oulu: Johannes Kepler University Linz, 2011, pp. 21-22. ISBN 978-3-902457-30-1.
 STRNADEL Josef. Návrh časově kritických systémů III: priorita úloh. Automa. 2011, vol. 2011, no. 2, pp. 50-52. ISSN 1210-9592.
 STRNADEL Josef. Návrh časově kritických systémů IV: realizace prostředky RTOS. Automa. 2011, vol. 2011, no. 4, pp. 58-60. ISSN 1210-9592.
 STRNADEL Josef. Proposal of Flexible Monitoring-Driven HW/SW Interrupt Management for Embedded COTS-Based Event-Triggered Real-Time Systems. In: Proceedings of the Work-in-Progress Session of the 32nd IEEE Real-Time Systems Symposium. Vienna: TU Vienna, 2011, pp. 29-32.
2010KOTÁSEK Zdeněk, ŠKARVADA Jaroslav and STRNADEL Josef. Reduction of Power Dissipation Through Parallel Optimization of Test Vector and Scan Register Sequences. In: Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Vienna: IEEE Computer Society, 2010, pp. 364-369. ISBN 978-1-4244-6610-8.
 KOTÁSEK Zdeněk, ŠKARVADA Jaroslav and STRNADEL Josef. The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption. In: Proceedings of 13th Euromicro Conference on Digital System Design Architectures, Methods and Tools. Los Alamitos: IEEE Computer Society, 2010, pp. 644-651. ISBN 978-0-7695-4171-6.
 STRNADEL Josef. Návrh časově kritických systémů I: specifikace a verifikace. Automa. 2010, vol. 2010, no. 10, pp. 42-44. ISSN 1210-9592.
 STRNADEL Josef. Návrh časově kritických systémů II: úlohy reálného času. Automa. 2010, vol. 2010, no. 12, pp. 18-19. ISSN 1210-9592.
 STRNADEL Josef. Task-Level Modeling and Design of Components for Construction of Dependable Time-Critical Systems Implemented by Means of RT Kernel. In: Sborník přednášek z 33. mezinárodní konference TD 2010 - DIAGON 2010. Zlín: Tomas Bata University in Zlín, 2010, pp. 99-104. ISBN 978-80-7318-940-2.
 ŠKARVADA Jaroslav, KOTÁSEK Zdeněk and STRNADEL Josef. Optimalizace aplikace testu číslicových systémů pro nízký příkon. Brno: Faculty of Information Technology BUT, 2010. ISBN 978-80-214-4209-2.
 ŠKARVADA Jaroslav, KOTÁSEK Zdeněk and STRNADEL Josef. The Use of Genetic Algorithm to Reduce Power Consumption during Test Application. In: Evolvable Systems: From Biology to Hardware. Berlin: Springer Verlag, 2010, pp. 181-192. ISBN 978-3-642-15322-8. ISSN 0302-9743.
2009STRNADEL Josef and RŮŽIČKA Richard. Testability Analysis Driven Data Path Modification And Controller Synthesis. In: Proceedings of 16th Electronic Devices and Systems IMAPS CS International Conference. Brno: Brno University of Technology, 2009, pp. 363-368. ISBN 978-80-214-3933-7.
 STRNADEL Josef. Univerzitní týmy soutěží na autodráze. Události (VUT News). 2009, vol. 2009, no. 4. ISSN 1211-4421.
 STRNADEL Josef. Overview of Mechanisms for Improving Reliability of Embedded Real-Time Systems. In: Proceedings of 32th International Conference TD - DIAGON 2009. Zlín: Tomas Bata University in Zlín, 2009, pp. 19-24. ISBN 978-80-7318-840-5.
2008STRNADEL Josef, PEČENKA Tomáš and KOTÁSEK Zdeněk. Measuring Design for Testability Tool Effectiveness by Means of FITTest_BENCH06 Benchmark Circuits. Computing and Informatics. Bratislava: Slovak Academic Press, 2008, vol. 27, no. 6, pp. 913-930. ISSN 1335-9150.
 STRNADEL Josef. Analýza a zlepšení testovatelnosti číslicových obvodů na úrovni meziregistrových přenosů. Brno: Faculty of Information Technology BUT, 2008. ISBN 978-80-214-3599-5.
 STRNADEL Josef. TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path. In: Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools. Los Alamitos: IEEE Computer Society, 2008, pp. 865-872. ISBN 978-0-7695-3277-6.
 STRNADEL Josef. Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method. In: Proceedings of Electronic Devices and Systems IMAPS CS International Conference. Brno: Brno University of Technology, 2008, pp. 367-372. ISBN 978-80-214-3717-3.
2007RŮŽIČKA Richard and STRNADEL Josef. Test Controller Synthesis Constrained by Circuit Testability Analysis. In: Proceedings of 10th Euromicro Conference on Digital System Design, Architectures, Methods and Tools. Los Alamitos: IEEE Computer Society Press, 2007, pp. 626-633. ISBN 0-7695-2978-X.
 STRNADEL Josef. Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis. In: Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference. Brno: Brno University of Technology, 2007, pp. 333-338. ISBN 978-80-214-3470-7.
 STRNADEL Josef. On Encoding and Utilization of Diagnostic Information Extracted from Design-Data for Testability Analysis Purposes. In: Proceedings of the 6th Electronic Circuits and Systems Conference. Bratislava: Slovak University of Technology in Bratislava, 2007, pp. 171-176. ISBN 978-80-227-2697-9.
2006KOTÁSEK Zdeněk and STRNADEL Josef. SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System. In: Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS). Los Alamitos, CA: IEEE Computer Society, 2006, pp. 497-498. ISBN 0-7695-2546-6.
 PEČENKA Tomáš, STRNADEL Josef, KOTÁSEK Zdeněk and SEKANINA Lukáš. Testability Estimation Based on Controllability and Observability Parameters. In: Proceedings of the 9th EUROMICRO Conference on Digital System Design (DSD'06). Cavtat: IEEE Computer Society, 2006, pp. 504-514. ISBN 0-7695-2609-8.
 STRNADEL Josef and DHALI Arghya. Novel Optimizing Approach in the Area of STEP-Based Construction of Sessionless, Power-Constrainted, TAM and Time Optimal Test Schedules. In: Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS). Los Alamitos, CA: IEEE Computer Society, 2006, pp. 360-367. ISBN 0-7695-2546-6.
 STRNADEL Josef. On Distribution of Testability Values in Scan-Layout State-Space. In: Proceedings of the 7th International Scientific Conference on Electronic Computers and Informatics. Košice: The University of Technology Košice, 2006, pp. 308-313. ISBN 80-8073-598-0.
 STRNADEL Josef. Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space. In: Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems. Prague: Czech Technical University Publishing House, 2006, pp. 161-162. ISBN 1-4244-0184-4.
 STRNADEL Josef. Testability Analysis and Improvements of Register-Transfer Level Digital Circuits. Computing and Informatics. Bratislava: Slovak Academic Press, 2006, vol. 25, no. 5, pp. 441-464. ISSN 1335-9150.
2005KOTÁSEK Zdeněk and STRNADEL Josef et al. Testing Tools for Training and Education. In: Proceedings of 12th International Conference on Mixed Design of Integrated Circuits and Systems. Krakow: Department of Microelectronics and Computer Science, Technical University of Lodz, 2005, pp. 671-676. ISBN 83-919289-9-3.
 KOTÁSEK Zdeněk, STRNADEL Josef and PEČENKA Tomáš. Methodology of Selecting Scan-Based Testability Improving Technique. In: Proc. of 8th IEEE Design and Diagnostic of Electronic Circuits and Systems Workshop. Sopron: University of West Hungary, 2005, pp. 186-189. ISBN 963-9364-48-7.
 PEČENKA Tomáš, KOTÁSEK Zdeněk, SEKANINA Lukáš and STRNADEL Josef. Automatic Discovery of RTL Benchmark Circuits with Predefined Testability Properties. In: Proc. of the 2005 NASA/DoD Conference on Evolvable Hardware. Los Alamitos: IEEE Computer Society Press, 2005, pp. 51-58. ISBN 0-7695-2399-4.
 STRNADEL Josef and KOTÁSEK Zdeněk. Educational Tool for the Demonstration of Dft Principles Based on Scan Methodologies. In: Proceedings of 8th Euromicro Conference on Digital System Design. Los Alamitos: IEEE Computer Society, 2005, pp. 420-427. ISBN 0-7695-2433-8.
 STRNADEL Josef, PEČENKA Tomáš and SEKANINA Lukáš. On Testability Analysis Driven Generation of Synthetic Register-Transfer Level Benchmark Circuits. In: Proceedings of 5th Electronic Circuits and Systems Conference. Bratislava: Slovak University of Technology in Bratislava, 2005, pp. 107-110.
 STRNADEL Josef. VIRTA: Virtual Port Based Register-Transfer Level Testability Analysis and Improvements. In: Proceedings of 8th IEEE Design and Diagnostic of Electronic Circuits and Systems Workshop. Sopron: University of West Hungary, 2005, pp. 190-193. ISBN 963-9364-48-7.
2004KOTÁSEK Zdeněk, MIKA Daniel and STRNADEL Josef. The Identification of Registers in RTL Structures. In: Preliminary Proceedings of 1st International Symposium on Leveraging Applications of Formal Methods ISOLA 2004. Nicosia: Department of Computer Science of University of Cyprus, 2004, pp. 317-320. ISBN 3-540-41613.
 KOTÁSEK Zdeněk, PEČENKA Tomáš and STRNADEL Josef. Improving Testability Parameters of Pipelined Circuits Through the Identification of Testable Cores. In: Proc. of the 7th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems. Bratislava: Slovak Academy of Science, 2004, pp. 99-104. ISBN 80-969117-9-1.
 KOTÁSEK Zdeněk, PEČENKA Tomáš, SEKANINA Lukáš and STRNADEL Josef. Evolutionary Design of Synthetic RTL Benchmark Circuits. In: Informal Digest of Papers, IEEE European Test Workshop 2004. Montpellier: IEEE Computer Society, 2004, pp. 107-108. ISBN 000000000.
 KOTÁSEK Zdeněk, PEČENKA Tomáš, STRNADEL Josef, MIKA Daniel and SEKANINA Lukáš. An Overview of Research Activities in Digital Circuit Diagnosis and Benchmarking. In: Proceedings of the Sixth Internation Scientific Conference Electronic Computers nad Informatics 2004. Košice: The University of Technology Košice, 2004, pp. 229-234. ISBN 80-8073-150-0.
 STRNADEL Josef and KOTÁSEK Zdeněk. System ScanEduTool, didactic instrument for education of scan technique principles. Brno: Faculty of Information Technology BUT, 2004.
 STRNADEL Josef. Analýza a zlepšení testovatelnosti číslicového obvodu na úrovni meziregistrových přenosů. Brno, 2004.
 STRNADEL Josef. Analýza a zlepšení testovatelnosti číslicového obvodu na úrovni meziregistrových přenosů. In: Zborník príspevkov Česko-slovenského seminára pre študentov doktorandského štúdia Počítačové architektúry & Diagnostika (PAD). Bratislava: Slovak Academy of Science, 2004, pp. 138-143. ISBN 80-969202-0-0.
2003KOTÁSEK Zdeněk, MIKA Daniel and STRNADEL Josef. Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. In: Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. Poznaň: Publishing House of Poznan University of Technology, 2003, pp. 233-238. ISBN 83-7143-557-6.
 KOTÁSEK Zdeněk, MIKA Daniel and STRNADEL Josef. Test scheduling for embedded systems. In: Proceedings EUROMICRO Symposium on Digital System Design - Architectures, Methods and Tools DSD 2003. Belek: IEEE Computer Society Press, 2003, pp. 463-467. ISBN 0-7695-2003-0.
 STRNADEL Josef. Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability. In: Proceedings of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. Poznan: Publishing House of Poznan University of Technology, 2003, pp. 303-304. ISBN 83-7143-557-6.
 STRNADEL Josef. Analýza a zlepšení testovatelnosti RTL číslicového obvodu. In: Sborník příspěvků ze semináře Počítačové Architektury & Diagnostika. Brno: Faculty of Information Technology BUT, 2003, pp. 24-29. ISBN 80-214-2471-0.
 STRNADEL Josef. Nested Loops Degree Impact on RTL Digital Circuit Testability. In: Programmable Devices and Systems. Oxford: Elsevier Science, 2003, pp. 202-207. ISBN 0-08-044130-0.
 STRNADEL Josef. Scan Layout Encoding by Means of a Binary String. In: Proceedings of 37th International Conference on Modelling and Simulation of Systems. Ostrava, 2003, pp. 115-122. ISBN 80-85988-86-0.
2002MIKA Daniel, KOTÁSEK Zdeněk and STRNADEL Josef. Test Controller Design Based on VHDL Source File Analysis. In: Proceedings of The Fifth International Scientific Conference Electronic Computers and Informatics 2002. Letná 42, 040 01 TU Košice: The University of Technology Košice, 2002, pp. 135-141. ISBN 80-7099-879-2.
 STRNADEL Josef and KOTÁSEK Zdeněk. Normalized Testability Measures at RT Level: Utilization and Reasons for Creation. In: Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems. Ostrava, 2002, pp. 297-304. ISBN 80-85988-71-2.
 STRNADEL Josef and KOTÁSEK Zdeněk. Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm. In: Proceedings of 5th IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop. Brno: Brno University of Technology, 2002, pp. 44-51. ISBN 80-214-2094-4.
 STRNADEL Josef and KOTÁSEK Zdeněk. Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level. In: Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002. Los Alamitos: IEEE Computer Society Press, 2002, pp. 166-173. ISBN 0-7695-1790-0.
 STRNADEL Josef. Evaluating Cost/Quality Trade-off Solutions Proposed During a DFT Process. In: Proceeding of 8th Conference Student EEICT 2002. Brno: Brno University of Technology, 2002, pp. 506-510. ISBN 80-214-2116-9.
 STRNADEL Josef. Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis. In: Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002. Košice: The University of Technology Košice, 2002, pp. 200-205. ISBN 80-7099-879-2.
 ZBOŘIL František V., KOTÁSEK Zdeněk, MIKA Daniel and STRNADEL Josef. The Identification of Feedback Loops in RTL Structures. In: Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002. Košice: The University of Technology Košice, 2002, pp. 142-147. ISBN 80-7099-879-2.
2001HLAVIČKA Jan, KOTÁSEK Zdeněk, RŮŽIČKA Richard and STRNADEL Josef. Interactive Tool for Behavioral Level Testability Analysis. In: Proceedings of the IEEE ETW 2001. Stockholm, 2001, pp. 117-119.
 KOTÁSEK Zdeněk and STRNADEL Josef. Analytic Approach to RTL Testability Analysis. In: Proceedings of 7th Conference Student FEI 2001. Brno: Brno University of Technology, 2001, pp. 363-367. ISBN 80-214-1860-5.
 KOTÁSEK Zdeněk and STRNADEL Josef. RTL Testability Analysis Based on Genetic Algorithm Implementation. In: Proceedings of the Tenth ICNACSA. Plovdiv: unspecified agency, 2001, p. 1.
 KOTÁSEK Zdeněk and STRNADEL Josef. RTL Testability Analysis Based on Genetic Algorithm Implementation. In: Proceedings of the IWCIT'01. Ostrava: Faculty of Electrical Engineering and Computer Science, VSB-TU Ostrava, 2001, pp. 83-88. ISBN 80-7078-907-7.
 KOTÁSEK Zdeněk, RŮŽIČKA Richard and STRNADEL Josef. Formal and Analytical Approaches to the Testability Analysis - the Comparison. In: Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001. Gyor: SZIF-UNIVERSITAS Ltd., Hungary, 2001, pp. 123-128. ISBN 963-7175-16-4.
 KOTÁSEK Zdeněk, RŮŽIČKA Richard, STRNADEL Josef and ZBOŘIL František. Two Level Testability System. In: Proceedings of the 35th Spring International Conference MOSIS'01. Ostrava, 2001, pp. 433-440. ISBN 80-85988-57-7.
2000STRNADEL Josef. Využití pseudotriviálních testů v diagnostice. In: Sborník prací studentů a doktorandů. Brno: Akademické nakladatelství CERM, 2000, pp. 249-251. ISBN 80-7204-155-X.

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