Publication Details

Nested Loops Degree Impact on RTL Digital Circuit Testability

STRNADEL Josef. Nested Loops Degree Impact on RTL Digital Circuit Testability. In: Programmable Devices and Systems. Oxford: Elsevier Science, 2003, pp. 202-207. ISBN 0-08-044130-0.
Type
conference paper
Language
english
Authors
Keywords

Testability, feedback loop, directed graph, ordered set, graph algorithm

Abstract

The existence of loops in a circuit structure causes problems in both test generation and application. Thus, the problem of identifying loops becomes an important task during testability analysis or, later, e.g., during allocation-for testability process. When nested loops occur in the circuit, it is necessary to accurately determine the most nested one to improve circuit testability significantly, with minimal design cost. This paper deals with the problem of identifying nested loops including their nesting degree in the register-transfer level (RTL) digital circuit structure as well as with the impact of such loops on the circuit testability.

Published
2003
Pages
202-207
Proceedings
Programmable Devices and Systems
Conference
IFAC Workshop on Programmable Devices and Systems, Ostrava, CZ
ISBN
0-08-044130-0
Publisher
Elsevier Science
Place
Oxford, GB
BibTeX
@INPROCEEDINGS{FITPUB7135,
   author = "Josef Strnadel",
   title = "Nested Loops Degree Impact on RTL Digital Circuit Testability",
   pages = "202--207",
   booktitle = "Programmable Devices and Systems",
   year = 2003,
   location = "Oxford, GB",
   publisher = "Elsevier Science",
   ISBN = "0-08-044130-0",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7135"
}
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