Události

IEEE Latin American Test Symposium

Hotel Fundador, Santiago de Chile 11.-13.3.2019

Vybrané publikace

2019LOJDA Jakub, PODIVÍNSKÝ Jakub a KOTÁSEK Zdeněk. Reliability Indicators for Automatic Design and Analysis of Fault-Tolerant FPGA Systems. In: 20th IEEE Latin American Test Symposium (LATS 2019). Santiago: IEEE Computer Society, 2019, s. 93-96. ISBN 978-1-72811-755-3.
 PODIVÍNSKÝ Jakub, LOJDA Jakub a KOTÁSEK Zdeněk. Extended Reliability Analysis of Fault-Tolerant FPGA-based Robot Controller. In: 20th IEEE Latin American Test Symposium (LATS 2019). Santiago: IEEE Computer Society, 2019, s. 97-100. ISBN 978-1-72811-755-3.
 SZURMAN Karel a KOTÁSEK Zdeněk. Coarse-Grained TMR Soft-Core Processor Fault Tolerance Methods and State Synchronization for Run-Time Fault Recovery. In: 20th IEEE Latin American Test Symposium (LATS 2019). Santiago: IEEE Computer Society, 2019, s. 32-35. ISBN 978-1-72811-755-3.

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