Publication Details

Retargetable Multi-level Debugging in HW/SW Codesign

KŘOUSTEK Jakub, PŘIKRYL Zdeněk, KOLÁŘ Dušan and HRUŠKA Tomáš. Retargetable Multi-level Debugging in HW/SW Codesign. In: The 23rd International Conference on Microelectronics (ICM 2011). Hammamet: Institute of Electrical and Electronics Engineers, 2011, pp. 1-6. ISBN 978-1-4577-2209-7. Available from: https://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6177413
Czech title
Rekonfigurovatelný víceúrovňový ladicí nástroj pro HW/SW codesign
Type
conference paper
Language
english
Authors
Křoustek Jakub, Ing. (DIFS FIT BUT)
Přikryl Zdeněk, Ing., Ph.D. (DIFS FIT BUT)
Kolář Dušan, doc. Dr. Ing. (DIFS FIT BUT)
Hruška Tomáš, prof. Ing., CSc. (DIFS FIT BUT)
URL
Keywords

debugging; breakpoint; simulation; DWARF; JTAG;  architecture description languages; application-specific instruction set processors

Abstract

Debugging is a standard part of an embedded system design process. The debugger is used for a target application debugging and for a testing of the designed system. The target application debugging can be performed either on a statement-accurate level (i.e. source-language level debugging) or on an instruction-accurate level (i.e. assembly-language level debugging). The architecture design debugging is done on a cycle-accurate level. Nowadays embedded systems are often parallel-based. Therefore, it is important to allow debugging of systems with more than one application-specific instruction set processors (ASIP). Since the current trend of ASIP design is focused on automatic tool-chain generation, the debugger must be retargetable to arbitrary architecture. In this paper, we present the concept of an automatically generated multi-level retargetable debugger. This debugger can operate on each of the previously mentioned levels and it allows debugging of multiprocessor systems. The experimental results can be found at the end of the paper.

Published
2011
Pages
1-6
Proceedings
The 23rd International Conference on Microelectronics (ICM 2011)
Conference
The 23rd International Conference on Microelectronics, Hammamet, TN
ISBN
978-1-4577-2209-7
Publisher
Institute of Electrical and Electronics Engineers
Place
Hammamet, TN
DOI
10.1109/ICM.2011.6177413
BibTeX 
@INPROCEEDINGS{FITPUB9558,
   author = "Jakub K\v{r}oustek and Zden\v{e}k P\v{r}ikryl and Du\v{s}an Kol\'{a}\v{r} and Tom\'{a}\v{s} Hru\v{s}ka",
   title = "Retargetable Multi-level Debugging in HW/SW Codesign",
   pages = "1--6",
   booktitle = "The 23rd International Conference on Microelectronics (ICM 2011)",
   year = 2011,
   location = "Hammamet, TN",
   publisher = "Institute of Electrical and Electronics Engineers",
   ISBN = "978-1-4577-2209-7",
   doi = "10.1109/ICM.2011.6177413",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/9558"
}
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