Prof. Ing. Lukáš Sekanina, Ph.D.

SEKANINA Lukáš, VAŠÍČEK Zdeněk, BOSIO Alberto, TRAIOLA Marcello, RECH Paolo, OLIVEIRA Daniel, FERNANDES Fernando and DI Carlo Stefano. Special Session: How Approximate Computing impacts Verification, Test and Reliability. 2018 IEEE 36th VLSI Test Symposium. San Francisco: IEEE Computer Society, 2018. ISBN 978-1-5386-3774-6.
Publication language:english
Original title:Special Session: How Approximate Computing impacts Verification, Test and Reliability
Title (cs):Speciální sekce: Jak aproximativní počítání ovlivňuje verifikaci, testování a spolehlivost
Book:2018 IEEE 36th VLSI Test Symposium
Conference:IEEE VLSI Test Symposium 2018
Place:San Francisco, US
Publisher:IEEE Computer Society
+Type Name Title Size Last modified
icon02B-1.pdf92,9 KB2018-05-07 10:10:51
^ Select all
With selected:
digital circuit, approximate computing, verification, test, reliability
A new design paradigm -- approximate computing -- was established to investigate how computer systems can be made better -- more energy efficient, faster, and less complex -- by relaxing the requirement that they are exactly correct. The purpose of this special session is to introduce and discuss how approximate computing can and how impact the verification, the test and the reliability of digital circuits. The presentations of the special session will propose two views: (i): how the approximate computing paradigm impacts the design and manufacturing flow of integrated circuits; (ii): how the verification, testing and reliability disciplines can be exploited in the approximate computing paradigms.

Your IPv4 address: